Stress Reduction of Ge_2Sb_2Te_5 by Inhibiting Oxygen Diffusion
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概要
- 論文の詳細を見る
- 2008-09-01
著者
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Yu Byoung
Electronics And Telecommunications Res. Inst. Daejeon Kor
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Yu Byoung
Electronics And Telecommunications Research Institute (etri)
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Lee Seung-yun
Electronics And Telecommunications Research Institute Microelectronics Laboratory
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Lee Seung-yun
Electronics And Telecommunications Research Institute (etri)
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Park Young
Electronics And Telecommunications Research Institute (etri)
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Yoon Sung-Min
Electronics and Telecommunications Res. Inst. (ETRI)
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Yoon Sung-min
Electronics And Telecommunications Research Institute (etri)
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LIM Jung
Electronics and Telecommunications Research Institute (ETRI)
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YANG Woo
Electronics and Telecommunications Research Institute (ETRI)
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Yang Woo
Electronics And Telecommunications Research Institute
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