Characteristics of Band-to-Band Hot Hole Injection for Erasing Operation in Charge Trapping Memory
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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ZHU Jun
Institute of Forensic Science, Ministry of Public Security
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Zhu Jun
Institute Of Microelectronics Tsinghua University
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Zhu Jun
Institute Of Forensic Science Ministry Of Public Security
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Pang Huiqing
Institute Of Microelectronics Tsinghua University
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Sun Lei
Institute Of Microelectronics Tsinghua University
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PAN Liyang
Institute of Microelectronics, Tsinghua University
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ZENG Ying
Institute of Microelectronics, Tsinghua University
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ZHANG Zhaojian
Institute of Microelectronics, Tsinghua University
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CHEN John
Semiconductor Manufacturing International Corporation
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Zeng Ying
Institute Of Microelectronics Tsinghua University
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Pan Liyang
Institute Of Microelectronics Tsinghua University
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Zhang Zhaojian
Institute Of Microelectronics Tsinghua University
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Sun Lei
Institute Of Microelectronics Peking University
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