Lateral Redistribution and Interactive Impacts of Localized Trapped Charges during Retention Baking in SONOS Memory
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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ZHU Jun
Institute of Forensic Science, Ministry of Public Security
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Zhu Jun
Institute Of Microelectronics Tsinghua University
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Zhu Jun
Institute Of Forensic Science Ministry Of Public Security
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Pang Huiqing
Institute Of Microelectronics Tsinghua University
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Wu Dong
Institute Of Microelectronics Tsinghua University
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Sun Lei
Institute Of Microelectronics Tsinghua University
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PAN Liyang
Institute of Microelectronics, Tsinghua University
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Pan Liyang
Institute Of Microelectronics Tsinghua University
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Sun Lei
Institute Of Microelectronics Peking University
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- Lateral Redistribution and Interactive Impacts of Localized Trapped Charges during Retention Baking in SONOS Memory
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- Distribution and Impact of Local Trapped Charges in SONOS Memory
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