ZENG Ying | Institute of Microelectronics, Tsinghua University

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概要

• ZENG Yingの詳細を見る
• 同名の論文著者
• Institute of Microelectronics, Tsinghua Universityの論文著者

関連著者

• ZHU Jun

  Institute of Forensic Science, Ministry of Public Security

• Zhu Jun

  Institute Of Microelectronics Tsinghua University

• Sun Lei

  Institute Of Microelectronics Tsinghua University

• PAN Liyang

  Institute of Microelectronics, Tsinghua University

• ZENG Ying

  Institute of Microelectronics, Tsinghua University

• Zhu Jun

  Institute Of Forensic Science Ministry Of Public Security

• Pang Huiqing

  Institute Of Microelectronics Tsinghua University

• ZHANG Zhaojian

  Institute of Microelectronics, Tsinghua University

• Zeng Ying

  Institute Of Microelectronics Tsinghua University

• Pan Liyang

  Institute Of Microelectronics Tsinghua University

• Zhang Zhaojian

  Institute Of Microelectronics Tsinghua University

• Sun Lei

  Institute Of Microelectronics Peking University

• WANG Jimin

  Institute of Microelectronics, Tsinghua University

• LI Xiyou

  Institute of Microelectronics, Tsinghua University

• Li Xiyou

  Institute Of Microelectronics Tsinghua University

• Wang Jimin

  Institute Of Microelectronics Tsinghua University

• Wu Dong

  Institute Of Microelectronics Tsinghua University

• CHEN John

  Semiconductor Manufacturing International Corporation

• FU Yuxia

  Institute of Microelectronics, Tsinghua University

• DUAN Zhigang

  Institute of Microelectronics, Tsinghua University

• LIU Jianzhao

  Institute of Microelectronics, Tsinghua University

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著作論文

• Characteristics of Band-to-Band Hot Hole Injection for Erasing Operation in Charge Trapping Memory
• Distribution and Impact of Local Trapped Charges in Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) Memory
• Distribution and Impact of Local Trapped Charges in SONOS Memory
• Low-Voltage and Low-Current Flash Memory Using Source Induced Band-to-Band Tunneling Hot Electron Injection to Perform Programming

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