Optimum Voltage Scaling and Structure Design for the Low Voltage Operation of FN Type Flash EEPROM with High Reliability and Constant Programming Time
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概要
- 論文の詳細を見る
- 1996-08-26
著者
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MIYOSHI H.
ULSI Laboratory, Mitsubishi Electric Corporation
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Inuishi M.
Ulsi Development Center Mitsubishi Electric Corporation
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UENO S.
ULSI Development Center, Mitsubishi Electric Corporation
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Ajika N.
Ulsi Laboratory Mitsubishi Electric Corporation
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ODA H.
ULSI Laboratory, Mitsubishi Electric Corporation
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