ODA H. | ULSI Laboratory, Mitsubishi Electric Corporation
スポンサーリンク
概要
関連著者
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Inuishi M.
Ulsi Development Center Mitsubishi Electric Corporation
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ODA H.
ULSI Laboratory, Mitsubishi Electric Corporation
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INOUE Y.
ULSI Laboratory, Mitsubishi Electric Corporation
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MIYOSHI H.
ULSI Laboratory, Mitsubishi Electric Corporation
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Sayama H.
Ulsi Development Center Mitsubishi Electric Corporation
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UENO S.
ULSI Development Center, Mitsubishi Electric Corporation
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Ajika N.
Ulsi Laboratory Mitsubishi Electric Corporation
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OTA K.
ULSI Development Center, Mitsubishi Electric Corporation
著作論文
- Optimum Voltage Scaling and Structure Design for the Low Voltage Operation of FN Type Flash EEPROM with High Reliability and Constant Programming Time
- 80nm High Performance CMOSFET with Low Gate Leakage Current Using Conventional Thin Gate Nitric Oxide