Contact Resistance of SnO_2 Films Determined by the Transmission Line Model Method
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概要
- 論文の詳細を見る
- 1998-06-01
著者
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Wang Z
Tokyo Inst. Technol. Tokyo Jpn
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KAMIMURA Kiichi
Department of Electric and Electronic Engineering, Faculty of Engineering, Shinshu University
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WANG ZhanHe
Department of Electric and Electronic Engineering, Faculty of Engineering, Shinshu University
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ONUMA Yoshiharu
Department of Electric and Electronic Engineering, Faculty of Engineering, Shinshu University
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Onuma Y
Faculty Of Engineering Shinshu University
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Kamimura K
Faculty Of Engineering Shinshu University
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Kamimura K
Keio Univ. Yokohama Jpn
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