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Hitachi High-technologies Corporation | 論文
- Development of a technique for high resolution electron microscopic observation of nano-materials at elevated temperatures
- In situ high temperature TEM observation of interaction between multi-walled carbon nanotube and in situ deposited gold nano-particles
- Development of dedicated STEM with high stability
- Spatially-resolved EELS analysis of multilayer using EFTEM and STEM
- Impact of Long-Period Line-Edge Roughness (LER) on Accuracy in Critical Dimension (CD) Measurement and New Guideline for CD Metrology
- A Detection Method for a T-Topped Profile in Resist Patterns by Top-Down-View Critical Dimension Scanning Electron Microscope
- Wafer-Voltage Measurement in Plasma Processes by Means of a New Probe Method and an Impedance Monitor
- Fibroblast growth factor receptor 3 mutation in voided urine is a useful diagnostic marker and significant indicator of tumor recurrence in non-muscle invasive bladder cancer
- A method for characterizing carbon nanotubes
- Low vacuum scanning electron microscopy for paraffin sections utilizing the differential stainability of cells and tissues with platinum blue
- Characterization of Line-edge Roughness in Cu/low-k Interconnect Pattern
- 2次元マップ糖鎖分析法の医療研究への応用
- The development and characteristics of a high-speed EELS mapping system for a dedicated STEM
- Low voltage FE-STEM for characterization of state-of-the-art silicon SRAM
- Analysis of Saccharides Possessing Post-translational Protein Modifications by Phenylhydrazine Labeling Using High-Performance Liquid Chromatography
- Three-Dimensional Structure Analysis of Metal-Oxide-Insulator Field Effect Transistors with Different Electrical Properties by Scanning Transmission Electron Microscopy
- Analysis of dislocations in strained-Si/SiGe devices by EBIC technique
- Transmission Electron Microscope Sample Shape Optimization for Energy Dispersive X-Ray Spectroscopy Using the Focused Ion Beam Technique
- A Detection Method for a T-Topped Profile in Resist Patterns by Top-Down-View Critical Dimension Scanning Electron Microscope
- Rapid three-dimensional analysis of renal biopsy sections by low vacuum scanning electron microscopy