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Department of Information Systems Engineering, Faculty of Engineering, Osaka University | 論文
- A Fast Minimum Cost Flow Algorithm for Regenerating Optimal Layout of Functional Cells
- Edge Roughness Study of Chemically Amplified Resist in Low-Energy Electron-Beam Lithography Using Computer Simulation
- A New Approach to Rectangle Packing Problem Based on Stochastic Tabu Search
- Observation of Nuclear Excitation by Electron Transition (NEET) in ^Au with a Nanosecond Stroboscopic Electron Spectrometer
- Ion Channeling Study of Epitaxially Grown HoBa_2Cu_3O_x Thin Films on MgO(001)
- Three-Dimensional Eye Movement Simulator Extracting Instantaneous Eye Movement Rotation Axes, the Plane Formed by Rotation Axes, and Innervations for Eye Muscles(Medical Engineering)
- EB Tester Line Delay Fault Localization Algorithm for Combinational Circuits Considering CAD Layout(Special Issue on Test and Verification of VLSI)
- Evaluation of Inspection Process Strategies through VLSI Wafer-Process Simulation Analysis
- Fault Diagnosis Technique for Yield Enhancement of Logic LSI Using I_DDQ(Special Section on Reliability Theory and Its Applications)
- Verification of Wafer Test Process Simulation in VLSI Manufacturing System and Its Application
- Effect of 300mm Wafer Transition and Test Processing Logistics on VLSI Manufacturing Final Test Process Efficiency and Cost
- Effect of Express Lots on Production Dispatching Rule Scheduling and Cost in VLSI Manufacturing Final Test Process
- Hierarchical Fault Tracing for VLSIs with Bi-directional Busses from CAD Layout Data in the CAD-Linked EB Test System
- Automatic Transistor-Level Performance Fault Tracing by Successive Circuit Extraction from CAD Layout Data for VLSI in the CAD-Linked EB Test System
- Matching of DUT Interconnection Pattern with CAD Layout in CAD-Linked Electron Beam Test System (Special Issue on LSI Failure Analysis)
- Automatic Tracing of Transistor-Level Performance Faults with CAD-Linked Electron Beam Test System
- Time- and Space-Focusing Detector System for Real-Time Electron Beam Testing
- Measurement of Surface Vacuum Potential from the Energy Spectrum of the Secondary Electron in the Scanning Electron Microscope