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Department Of Materials Science Faculty Of Engineering Kitami Institute Of Technology | 論文
- CPM2000-90 NbドープSrTiO_3薄膜の膜質に及ぼすMgO基板表面処理とポストアニールの影響
- CPM2000-76 導電性RhO2薄膜の電気特性に及ぼす熱処理の影響
- CPM2000-72 WOx薄膜の形成過程とその電気及び光学特性
- Effects of Sputtering Parameters on the Formation of Single-Oriented (002) Ti Film on Si
- Difference in Thermal Degradation Behavior of ZrO_2 and HfO_2 Anodized Capacitors
- Epitaxial Ir Thin Film on (001) MgO Single Crystal Prepared by Sputtering
- Capacitor Property and Leakage Current Mechanism of ZrO_2 Thin Dielectric Films Prepared by Anodic Oxidation
- Highly Texrured (100) RuO_2/(001) Ru Multilayers Preparedly by Sputtering
- Electrical Properties of HfO_2 Thin Insulating Film Prepared by Anodic Oxidation
- C-Axis-Oriented Ru Thin Fillns Prepared by Sputtering in Ar and O_2 Gas Mixture : Surfaces, Interfaces, and Films
- (200)TiN高配向膜上への(111)Al高配向成長に及ぼすAl_3Ti中間介在層の影響
- Realization of Cu(111) Single-Oriented State on SiO_2 by Annealing Cu-Zr Film and the Thermal Stability of Cu-Zr/ZrN/Zr/Si Contact System
- Single-Oriented Growth of(111)Cu Film on Thin ZrN/Zr Bilayered Film for ULSI Metallization
- Study on Preparation Conditions of Single-Oriented(002)Zr Thin Films on n-(001)Si
- Chemical Approach Using Tailored Liquid Sources for Traditional and Novel Ferroelectric Thin Films
- Local Piezoelectric Response in Bismuth-Based Ferroelectric Thin Films Investigated by Scanning Force Microscopy : Electnical Properties of Condensed Malter
- Structure and Ferroelectric Properties of Alkoxy-Derived Ca_2Bi_4Ti_5O_ Thin Films on Pt(111)/TiO_x/SiO_2/Si(100)
- Investigation of Domain Switching and Retention in Oriented PbZr_Ti_O_3 Thin Film by Scanning Force Microscopy
- 低化成電圧で作製したAl_3Hf陽極酸化膜キャパシタの熱劣化機構
- Al_3Hf金属間化合物の陽極酸化膜による高耐熱, 高信頼性薄膜キャパシタの検討