Investigation of Domain Switching and Retention in Oriented PbZr_<0.3>Ti_<0.7>O_3 Thin Film by Scanning Force Microscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-11-30
著者
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鈴木 久男
静岡大学工学部物質工学科
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Fu Desheng
Advanced Manufacturing Research Institute National Institute Of Advanced Industrial Science And Tech
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Fu Desheng
Research Institute Of Electronics Shizuoka University
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SUZUKI HISAO
Department of Material Science, Graduate School of Engineering, Shizuoka University
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KATO Kazumi
National Institute of Advanced Industrial Science and Technology (AIST)
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FU Desheng
National Institute of Advanced Industrial Science and Technology
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SUZUKI Kazuyuki
National Institute of Advanced Industrial Science and Technology
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MINAKATA Makoto
Research Institute of Electronics, Shizuoka Universiry
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鈴木 久男
静岡大 創造科学技術大学院
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Kato Kazumi
National Inst. Of Advanced Industrial Sci. And Technol. (aist)
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Suzuki K
Precision Equipment Company Nikon Corporation
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Kato K
Department Of Materials Science Faculty Of Engineering Kitami Institute Of Technology
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Fu Deshung
Ceramic Research Division National Institute Of Advanced Industrial Science And Technology
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Minakata M
Research Institute Of Electronics Shizuoka Universiry
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Suzuki K
Display Materials And Devices Laboratory Corporate Research And Development Center Toshiba Corporati
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Kato Kazumi
National Industrial Research Institute Of Nagoya
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Kato Kazumi
National Institute Of Advanced Industrial Science And Technology
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Suzuki Hisao
Department Of Electronic-mechanical Engineering Faculty Of Engineering Nagoya University
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Minakata Makoto
Research Institute Of Electrical Communication Tohoku University
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Suzuki Hisao
Departmennt of Materials Science, Shizuoka University, 3-5-1 Johoku, Hamamatsu 432-8561, Japan
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