OGAWA Shigeo | NTT LSI Laboratories

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概要

• OGAWA Shigeoの詳細を見る
• 同名の論文著者
• NTT LSI Laboratoriesの論文著者

関連著者

• OGAWA Shigeo

  NTT LSI Laboratories

• Shiono N

  Ntt Lsi Laboratories Nippon Telegraph And Telephone Corporation

• Ogawa Shigeo

  Ntt Lsi Laboratories Nippon Telegraph And Telephone Corporation

• Shimaya M

  Ntt Telecommunications Energy Laboratories

• Shimaya Masakazu

  Ntt Lsi Laboratories

• 小林 孝嘉

  東京大学理学系研究科

• Ogawa Shinji

  Department Of Electrical And Electronic Engineering And Information Engineering Nagoya University

• Ohsaki Shintaro

  Department Of Electrical And Electronic Engineering And Information Engineering Nagoya University

• Nakayama Satoshi

  NTT LSI Laboratories

• Kobayashi Toshio

  NTT LSI Laboratories

• Sakakibara Y

  National Institute Of Advanced Industrial Science And Technology (aist)

• Nakayama S

  Sii Nano Technology Inc.

• SAKAKIBARA Yutaka

  NTT LSI Laboratories

• Shiono Noboru

  NTT LSI Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato Wakamiya,

• SHIONO Noboru

  Reliability Center for Electronic Components of Japan (RCJ)

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著作論文

• Evaluation of Hot-Hole Induced Interface Traps at the Tunneling SiO_2(3.5nm)-Si Interface by the Conductance Technique
• Impact of Negative-Bias Temperature Instability on the Lifetime of Single-Gate CMOS Structures with Ultrathin (4–6 nm) Gate Oxides
• Impact of Negative-Bias Temperature Instability on the Lifetime of Single-Gate CMOS Structures with Ultrathin(4-6nm)Gate Oxides

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