Shiono Noboru | NTT LSI Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato Wakamiya,

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概要

• 同名の論文著者
• NTT LSI Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato Wakamiya,の論文著者

関連著者

• Shiono N

  Ntt Lsi Laboratories Nippon Telegraph And Telephone Corporation

• OGAWA Shigeo

  NTT LSI Laboratories

• Ogawa Shigeo

  Ntt Lsi Laboratories Nippon Telegraph And Telephone Corporation

• Shimaya M

  Ntt Telecommunications Energy Laboratories

• Shimaya Masakazu

  Ntt Lsi Laboratories

• Shiono Noboru

  NTT LSI Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato Wakamiya,

著作論文

• Impact of Negative-Bias Temperature Instability on the Lifetime of Single-Gate CMOS Structures with Ultrathin (4–6 nm) Gate Oxides

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