Ogawa Shigeo | Ntt Lsi Laboratories Nippon Telegraph And Telephone Corporation

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概要

• OGAWA Shigeoの詳細を見る
• 同名の論文著者
• Ntt Lsi Laboratories Nippon Telegraph And Telephone Corporationの論文著者

関連著者

• Shiono N

  Ntt Lsi Laboratories Nippon Telegraph And Telephone Corporation

• OGAWA Shigeo

  NTT LSI Laboratories

• Ogawa Shigeo

  Ntt Lsi Laboratories Nippon Telegraph And Telephone Corporation

• Shimaya M

  Ntt Telecommunications Energy Laboratories

• Shimaya Masakazu

  Ntt Lsi Laboratories

• Shiono Noboru

  NTT LSI Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato Wakamiya,

• SHIONO Noboru

  Reliability Center for Electronic Components of Japan (RCJ)

著作論文

• Impact of Negative-Bias Temperature Instability on the Lifetime of Single-Gate CMOS Structures with Ultrathin (4–6 nm) Gate Oxides
• Impact of Negative-Bias Temperature Instability on the Lifetime of Single-Gate CMOS Structures with Ultrathin(4-6nm)Gate Oxides

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