Gong Jeng | Department Of Electrical Engineer National Tsing Hua University

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著作論文

Modeling the Turn-off Characteristics of Insulated-Gate Bipolar Transistor
Hot Carrier Degradation in Deep Sub-Micron Nitride Spacer Lightly Doped Drain N-Channel Metal-Oxide-Semiconductor Transistors
Electrical Properties of High-Temperature Annealed Boron-Implanted Hg_Cd_Te
An Analytical Method of Analyzing Insulated-Gate Bipolar Transistor Characteristics in Terms of Applied Terminal Voltages : Semiconductors
The 1/f Noise Associated with Electromigration in AlSiCu Thin Films
A Simple Method to Analyze the Electrical Properties of High Power Lateral Double-Diffused Metal-Oxide-Semiconductor Transistors
The Effect of Band Gap Narrowing and Two-Dimensional Grain on High-Temperature Properties of Polysilicon Emitter Bipolar Junction Transistors
A General Method of Characterizing Base Resistance of Bipolar Junction Transistors
Temperature Dependence of Shallow-Trench-Isolation Mechanical Stress on n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors
Investigation of Positive and Negative Bias Temperature Instability of High-\kappa Dielectric Metal Gate Metal--Oxide--Semiconductor-Field-Effect-Transistors by Random Telegraph Signal

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