Chen David | United Microelectronics Corporation
スポンサーリンク
概要
関連著者
-
Chen David
United Microelectronics Corporation
-
LIAO Tsuoe-Hsiang
United Microelectronics Corporation
-
LAI Jinn-horng
Department of Electronics Engineering, National Thing Hua University
-
GONG Jeng
Department of Electronics Engineering, National Thing Hua University
-
Gong Jeng
Department Of Electrical Engineer National Tsing Hua University
-
Lai Jinn-horng
Department Of Electrical Engineer National Tsing Hua University
-
Chen David
United Microelectronics Corporation, Hsin-Chu, Taiwan 30034, R.O.C.
-
Lai Jinn-Horng
Department of Electrical Engineering, National Tsing-Hua University, Hsin-Chu, Taiwan 30055, R.O.C.
-
Liao Tsuoe-Hsiang
United Microelectronics Corporation, Hsin-Chu, Taiwan 30034, R.O.C.
著作論文
- Temperature Dependence of Shallow-Trench-Isolation Mechanical Stress on n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors
- Temperature Dependence of Shallow-Trench-Isolation Mechanical Stress on n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors