Gonda Satoshi | National Metrology Institute Of Japan Aist
スポンサーリンク
概要
関連著者
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Gonda Satoshi
National Metrology Institute Of Japan Aist
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GONDA Satoshi
National Metrology Institute of Japan, AIST
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KUROSAWA Tomizo
National Research Laboratory of Metrology
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KOJIMA Isao
National Institute of Materials and Chemical Research
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Kojima I
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Gonda S
The Institute Of Scientific And Industrial Research Osaka University
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Gonda Satoshi
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Kurosawa T
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Kojima Isao
National Chemical Laboratory For Industry
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Kurosawa Tomizo
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST)
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Yamanaka Sadanori
Nanotechnology Research Institute National Institute Of Advanced Industrial Science And Technology (
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OHMI Tadahiro
Tohoku University
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Tanaka M
Production Engineering Research Laboratory Hitachi Ltd.
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Tanaka M
Mitsubishi Electric Co. Ltd. Hyogo Jpn
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Tanaka Michiko
Tokyo University Of Agiculture And Technology Department Of Biotechnology
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Tokuda Norio
Nanotechnology Research Institute National Institute Of Advanced Industrial Science And Technology (
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Tokuda N
Univ. Tsukuba Ibaraki Jpn
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YAMABE Kikuo
Institute of Applied Physics, University of Tsukuba
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UMEZAWA Hitoshi
Diamond Research Center, AIST
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KATO Hiromitsu
Nanotechnology Research Institute, National Institute of Advanced Industrial Science and Technology
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OGURA Masahiko
Nanotechnology Research Institute, National Institute of Advanced Industrial Science and Technology
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OKUSHI Hideyo
Nanotechnology Research Institute, National Institute of Advanced Industrial Science and Technology
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YAMASAKI Satoshi
Nanotechnology Research Institute, National Institute of Advanced Industrial Science and Technology
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Tanaka M
New Materials Research Center Sanyo Electric Co. Ltd.
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FUJIMOTO Toshiyuki
National Institute of Advanced Industrial Science and Technology (AIST)
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Tanaka M
Manufacturing Development Center Mitsubishi Electric Corporation
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Ohmi Tadahiro
Tohoku Univ. Sendai Jpn
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Tokuda Norio
Diamond Research Center National Institute Of Advanced Industrial Science And Technology (aist)
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Tanaka M
Toshiba Corp. Kawasaki Jpn
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TANAKA Mitsuru
National Research Laboratory of Metrology
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Tanaka M
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Yamabe Kikuo
Institute Of Applied Physics University Of Tsukuba
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Tokuda Norio
Institute Of Science And Engineering Kanazawa University
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Ogura M
Jst‐crest Ibaraki Jpn
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Okushi H
Electrotechnical Lab. Ibaraki Jpn
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Okushi Hideyo
Energy Technology Research Institute National Institute Of Advanced Industrial Science And Technolog
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Kato Hiromitsu
Energy Technology Research Institute National Institute Of Advanced Industrial Science And Technolog
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Ogura Masahiko
Energy Technology Research Institute National Institute Of Advanced Industrial Science And Technolog
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Tokuda N
Institute Of Science And Engineering Kanazawa University
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Taino M
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Azuma Yasushi
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Umezawa Hitoshi
Diamond Research Center Aist
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Matsuzaki T
Department Of Applied Chemistry Faculty Of Engineering Himeji Institute Of Technology
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TAKAMASU Kiyoshi
The University of Tokyo
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MISUMI Ichiko
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technol
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SAKURAI Toshihisa
Tohoku University
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Misumi Ichiko
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Fujimoto Toshiyuki
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Ohmi Tadahiro
Tohoku Univ.
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Kato Hiromitsu
Nanotechnology Research Institute, AIST (National Institute of Advanced Industrial Science and Technology), Tsukuba Center 2, Tsukuba, Ibaraki 305-8568, Japan
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Umezawa Hitoshi
Diamond Res. Lab, National Inst. of Advanced Industrial Sci.
著作論文
- Nanometer Scale Height Standard Using Atomically Controlled Diamond Surface
- Sub-Nanometer Scale Measurements of Silicon Oxide Thickness by Spectroscopic Ellipsometry
- Reliability of parameters of associated base straight line in step height samples : Uncertainty evaluation in step height measurements using nanometrological AFM