Kurosawa Tomizo | National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST)
スポンサーリンク
概要
- KUROSAWA Tomizoの詳細を見る
- 同名の論文著者
- National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST)の論文著者
関連著者
-
KUROSAWA Tomizo
National Research Laboratory of Metrology
-
Kurosawa Tomizo
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST)
-
Kurosawa T
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
SAKURAI Toshio
National Research Laboratory of Metrology
-
KOJIMA Isao
National Institute of Materials and Chemical Research
-
Kojima I
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
Onae A
National Metrology Institute Of Japan (nmij)/national Institute Of Advanced Industrial Science And T
-
Onae Atsushi
National Metrology Institute Of Japan
-
Gonda S
The Institute Of Scientific And Industrial Research Osaka University
-
Gonda Satoshi
National Metrology Institute Of Japan Aist
-
Gonda Satoshi
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
TANAKA Keiichi
National Research Laboratory of Metrology
-
Kojima Isao
National Chemical Laboratory For Industry
-
OHMI Tadahiro
Tohoku University
-
Tanaka M
Production Engineering Research Laboratory Hitachi Ltd.
-
Tanaka M
Mitsubishi Electric Co. Ltd. Hyogo Jpn
-
Dobosz Marek
Warsaw Institute Of Technology
-
Tanaka Michiko
Tokyo University Of Agiculture And Technology Department Of Biotechnology
-
GONDA Satoshi
National Metrology Institute of Japan, AIST
-
Tanaka M
New Materials Research Center Sanyo Electric Co. Ltd.
-
Akimoto Yoshiaki
National Research Laboratory Of Metrology
-
Sakurai T
National Research Laboratory Of Metrology
-
FUJIMOTO Toshiyuki
National Institute of Advanced Industrial Science and Technology (AIST)
-
Tanaka M
Manufacturing Development Center Mitsubishi Electric Corporation
-
Ohmi Tadahiro
Tohoku Univ. Sendai Jpn
-
Tanaka M
Toshiba Corp. Kawasaki Jpn
-
MORINAGA Atsuo
National Research Laboratory of Metrology
-
TANAKA Mitsuru
National Research Laboratory of Metrology
-
Tanaka M
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
-
Miki Y
National Research Laboratory Of Metrology (nrlm)
-
Miki Yukinobu
National Research Laboratory Of Metrology
-
Taino M
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
-
Azuma Yasushi
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
SAKUMA Eiichi
National Research Laboratory of Metrology
-
Kawate Etsuo
National Research Laboratory of Metrology, 1-1-4 Umezono, Tsukuba 305-8563, Japan
-
Matsuzaki T
Department Of Applied Chemistry Faculty Of Engineering Himeji Institute Of Technology
-
Sakuma E
National Research Laboratory Of Metrology
-
USUDA Takashi
National Research Laboratory of Metrology, AIST, MITI
-
TAKAMASU Kiyoshi
The University of Tokyo
-
MISUMI Ichiko
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technol
-
SAKURAI Toshihisa
Tohoku University
-
Usuda Takashi
National Research Laboratory Of Metrology
-
Usuda Takashi
National Inst. Of Advanced Industrial Sci. And Technol.
-
Misumi Ichiko
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
Kawate E
National Research Laboratory Of Metrology
-
Kawate Etsuo
National Research Laboratory Of Metrology
-
Fujimoto Toshiyuki
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
Ohmi Tadahiro
Tohoku Univ.
著作論文
- Harmonic Generation and Mixing with the W-Ni Point Contact Diode in the Far-Infrared
- Sub-Nanometer Scale Measurements of Silicon Oxide Thickness by Spectroscopic Ellipsometry
- Frequency Stability and Reproducibility of an Iodine Stabilized He-Ne Laser
- Reliability of parameters of associated base straight line in step height samples : Uncertainty evaluation in step height measurements using nanometrological AFM
- Frequency Chain to 3.39 μm CH_4-Stabilized He-Ne Laser Using Josephson Point Contact as Harmonic Mixer
- W-YBa_2Cu_3O_ Point-Contact Junction at Millimeter-Wave
- Counting Error Elimination for Calibration of Vibration Pick-up Sensitivity in Fringe-counting Method
- Estimation of Small Signal Gain and Saturation Intensity in a Waveguide CO_2 Laser by a Curve-Fitting Technique
- Optical Feedback Effect in Iodine Stabilized He-Ne Laser with Long Path Interferometer