KUROSAWA Tomizo | National Research Laboratory of Metrology
スポンサーリンク
概要
関連著者
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KUROSAWA Tomizo
National Research Laboratory of Metrology
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Kurosawa Tomizo
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST)
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Kurosawa T
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Dobosz Marek
Warsaw Institute Of Technology
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Usuda Takashi
National Research Laboratory Of Metrology
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SAKURAI Toshio
National Research Laboratory of Metrology
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KOJIMA Isao
National Institute of Materials and Chemical Research
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Kojima I
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Onae A
National Metrology Institute Of Japan (nmij)/national Institute Of Advanced Industrial Science And T
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Onae Atsushi
National Metrology Institute Of Japan
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Gonda S
The Institute Of Scientific And Industrial Research Osaka University
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Gonda Satoshi
National Metrology Institute Of Japan Aist
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Gonda Satoshi
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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TANAKA Keiichi
National Research Laboratory of Metrology
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Kojima Isao
National Chemical Laboratory For Industry
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OHMI Tadahiro
Tohoku University
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Tanaka M
Production Engineering Research Laboratory Hitachi Ltd.
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Tanaka M
Mitsubishi Electric Co. Ltd. Hyogo Jpn
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Tanaka Michiko
Tokyo University Of Agiculture And Technology Department Of Biotechnology
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GONDA Satoshi
National Metrology Institute of Japan, AIST
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Tanaka M
New Materials Research Center Sanyo Electric Co. Ltd.
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Akimoto Yoshiaki
National Research Laboratory Of Metrology
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Sakurai T
National Research Laboratory Of Metrology
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FUJIMOTO Toshiyuki
National Institute of Advanced Industrial Science and Technology (AIST)
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Tanaka M
Manufacturing Development Center Mitsubishi Electric Corporation
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Ohmi Tadahiro
Tohoku Univ. Sendai Jpn
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Tanaka M
Toshiba Corp. Kawasaki Jpn
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MORINAGA Atsuo
National Research Laboratory of Metrology
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TANAKA Mitsuru
National Research Laboratory of Metrology
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Tanaka M
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Miki Y
National Research Laboratory Of Metrology (nrlm)
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Miki Yukinobu
National Research Laboratory Of Metrology
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Taino M
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Azuma Yasushi
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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SAKUMA Eiichi
National Research Laboratory of Metrology
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Kawate Etsuo
National Research Laboratory of Metrology, 1-1-4 Umezono, Tsukuba 305-8563, Japan
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Matsuzaki T
Department Of Applied Chemistry Faculty Of Engineering Himeji Institute Of Technology
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Sakuma E
National Research Laboratory Of Metrology
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USUDA Takashi
National Research Laboratory of Metrology, AIST, MITI
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TAKAMASU Kiyoshi
The University of Tokyo
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MISUMI Ichiko
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technol
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SAKURAI Toshihisa
Tohoku University
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Usuda Takashi
National Inst. Of Advanced Industrial Sci. And Technol.
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Misumi Ichiko
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Kawate E
National Research Laboratory Of Metrology
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Kawate Etsuo
National Research Laboratory Of Metrology
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Fujimoto Toshiyuki
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Ohmi Tadahiro
Tohoku Univ.
著作論文
- Harmonic Generation and Mixing with the W-Ni Point Contact Diode in the Far-Infrared
- Sub-Nanometer Scale Measurements of Silicon Oxide Thickness by Spectroscopic Ellipsometry
- Frequency Stability and Reproducibility of an Iodine Stabilized He-Ne Laser
- Reliability of parameters of associated base straight line in step height samples : Uncertainty evaluation in step height measurements using nanometrological AFM
- Frequency Chain to 3.39 μm CH_4-Stabilized He-Ne Laser Using Josephson Point Contact as Harmonic Mixer
- W-YBa_2Cu_3O_ Point-Contact Junction at Millimeter-Wave
- Counting Error Elimination for Calibration of Vibration Pick-up Sensitivity in Fringe-counting Method
- Methods for the calibration of vibration pick-ups by laser interferometry:2.Experimental verification
- Methods for the calibration of vibration pick-ups by laser interferometry:1.Theoretical analysis
- Properties of the S/N Ratio of the Beat Note in Frequency-Mixing Using the W-Ni Point Contact Diode at 32 THz
- Estimation of Small Signal Gain and Saturation Intensity in a Waveguide CO_2 Laser by a Curve-Fitting Technique
- Optical Feedback Effect in Iodine Stabilized He-Ne Laser with Long Path Interferometer