Usuda Takashi | National Inst. Of Advanced Industrial Sci. And Technol.
スポンサーリンク
概要
関連著者
-
Usuda Takashi
National Inst. Of Advanced Industrial Sci. And Technol.
-
USUDA Takashi
National Research Laboratory of Metrology, AIST, MITI
-
Usuda Takashi
National Research Laboratory Of Metrology
-
Dobosz Marek
Warsaw Institute Of Technology
-
Takagi Satoshi
National Inst. Of Advanced Industrial Sci. And Technol.
-
KUROSAWA Tomizo
National Research Laboratory of Metrology
-
Umeda A
National Res. Lab. Metrology Ibaraki Jpn
-
NAKANO Hidetoshi
National Research Laboratory of Metrology
-
Kubo Ryuichi
Yokohama Research & Development Center Murata Manufacturing Co. Ltd.
-
TANAKA Katsuhiko
Yokohama Research & Development Center, Murata Manufacturing Co., Ltd.
-
OHWADA Kuniki
Yokohama Research & Development Center, Murata Manufacturing Co., Ltd.
-
UMEDA Akira
National Research Laboratory of Metrology, AIST, MITI
-
UEDA Kazunaga
National Research Laboratory of Metrology, AIST, MITI
-
Umeda Akira
National Research Laboratory Of Metrology
-
Ohta Akihiro
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
Ohwada K
Yokohama Research & Development Center Murata Manufacturing Co. Ltd.
-
Usuda Takashi
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
Ueda Kazunaga
National Research Laboratory Of Metrology Aist Miti
-
Ishigami Tamio
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technol
-
Nakano Hidetoshi
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
Tanaka Katsuhiko
Yokohama Research & Development Center Murata Manufacturing Co. Ltd.
-
Ueda Akira
National Research Laboratory Of Metrology
-
Ishigami Tamio
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
-
Kurosawa Tomizo
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST)
著作論文
- Nanoscale verification of hardness indenters by atomic force microscopy
- Measurement of Piezoelectric Constant of ZnO Thin Film on Si Microstructure
- Counting Error Elimination for Calibration of Vibration Pick-up Sensitivity in Fringe-counting Method
- EVALUATIONS OF CHARGE AMPLIFIER AND VIBRATION EXCITER FOR THE ESTABLISHMENT OF VIBRATION STANDARDS
- An Electrostatically Driven Torsional Resonator with Two Degrees of Freedom (Part 1) -The Principle and Characteristics of Motion-