Iwai Hiroshi | Tokyo Inst. Of Technol. Yokohama‐shi Jpn
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概要
関連著者
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Iwai Hiroshi
Tokyo Inst. Of Technol. Yokohama‐shi Jpn
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IWAI Hiroshi
Tokyo Institute of Technology
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Iwai Hiroshi
Tokyo Inst. Of Technol. Yokohama Jpn
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Kakushima Kuniyuki
Tokyo Inst. Technol. Kanagawa Jpn
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IWAI Hiroshi
Frontier Research Center, Tokyo Institute of Technology
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KAKUSHIMA Kuniyuki
Interdisciplinary Graduate School of Science and Technology, Tokyo Institute of Technology
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SHIMOMURA Hiroshi
Panasonic Corporation
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Ohmi Shun-ichiro
Interdisciplinary Graduate School Of Science & Engineering Tokyo Institute Of Technology
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TSUTSUI Kazuo
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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Tsutsui Kazuo
Dept. Of Electronics And Applied Physics Tokyo Institute Of Technology
著作論文
- Parasitic Effects in Multi-Gate MOSFETs(Integrated Electronics)
- Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50nm Node MOSFETs
- Space-Charge-Limited Currents in La_2O_3 Thin Films Deposited by E-Beam Evaporation after Low Temperature Dry-Nitrogen Annealing
- Effect of Post-Metallization Annealing on Electrical Characteristics of La_2O_3 Gate Thin Films
- Precise Extraction of Metal Gate Work Function from Bevel Structures
- Equivalent Noise Temperature Representation for Scaled MOSFETs
- Study of Trap Generation in the Sc_2O_3/La_2O_3/SiO_x Gate Dielectric Stack by Scanning Tunneling Microscopy