UENO Kazuyoshi | NEC Electronics Corporation
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概要
関連著者
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Oda Noriaki
Nec Electronics Corp. Kawasaki‐shi Jpn
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UENO Kazuyoshi
NEC Electronics Corporation
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Oda Noriaki
Ulsi Device Development Division Nec Corporation
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YAMADA Kenta
NEC Electronics Corporation
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Yamada Kenta
Nec Electronics Corp. Kawasaki‐shi Jpn
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Kunishima Hiroyuki
Nec Electronics Corporation
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Suzuki Mieko
Nec Electronics Corporation
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Yamanaga Koh
Integrated Research Institute Tokyo Institute Of Technology
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Sekine Makoto
Nec Electronics Corporation
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KAWAHARA Naoyoshi
NEC Electronics Corporation
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KAKUHARA Yumi
NEC Electronics Corporation
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Honma Ichiro
Nec Electronics Corp. Kanagawa Jpn
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林 喜宏
NECシステムデバイス研究所
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林 喜宏
日本電気株式会社デバイスプラットフォーム研究所
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林 喜宏
日本電気株式会社マイクロエレクトロニクス研究所 超高集積回路研究部
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Goto Takayuki
Nec Electronics Corporation
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OHTO Koichi
NEC Electronics
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Hayashi Yoshihiro
Nec Corp. Kanagawa Jpn
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HAYASHI Yoshihiro
Device Platforms Research Labs., NEC.
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Horiuchi Tadahiko
Nec Electronics Corporation
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Takewaki Toshiyuki
Nec Electronics Corporation
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Ikeda Masahiro
Nec Electronics Corporation
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ITO Shinya
NEC Electronics Corporation
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SHIBA Kazutoshi
NEC Electronics Corporation
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HIRONAGA Nobuo
NEC Electronics Corporation
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HONMA Ichiro
NEC Electronics Corporation
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NANBA Hiroaki
NEC Electronics Corporation
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YOKOGAWA Shinji
NEC Electronics Corporation
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KAMEYAMA Akiko
NEC Electronics Corporation
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USAMI Tatsuya
NEC Electronics Corporation
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KUBO Akira
NEC Electronics Corporation
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YAMAMOTO Yoshiaki
NEC Electronics Corporation
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WATANABE Susumu
NEC Electronics Corporation
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Sone Shuji
Nec Electronics Corporation
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Ohto Koichi
Nec Electronics Corporation
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OHNISHI Sadayuki
NEC Electronics Corporation
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Shiba K
Nec Electronics Corporation
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Shiba Kazutoshi
Ulsi Device Development Division Nec Corporation
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IMURA Hironori
NEC Electronics Corporation
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TAGAMI Masayoshi
NEC Electronics Corporation
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UENO Kazuyoshi
Shibaura Institute of Technology, Dept. of Electronic Engineering
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Hayashi Yoshihiro
Nec Corporation
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Hayashi Yoshihiro
LSI Fundamental Research Laboratory, NEC Electronics Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
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Hayashi Yoshihiro
System Devices Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
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Hayashi Yoshihiro
System Devices Research Laboratories, NEC, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
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Hayashi Yoshihiro
System Devices and Fundamental Research, NEC Corporation, 1120, Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
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Hayashi Yoshihiro
Microelectronics Research Laboratories, NEC, 1120, Shimokuzawa, Sagamihara, Kanagawa 229, Japan
著作論文
- A Robust Embedded Ladder-Oxide/Cu Multilevel Interconnect Technology for 0.13μm Complementary Metal Oxide Semiconductor Generation
- Chip-Level Performance Maximization Using ASIS (Application-Specific Interconnect Structure) Wiring Design Concept for 45nm CMOS Generation(Device,Low-Power, High-Speed LSIs and Related Technologies)
- Key mechanisms for improved EM lifetime of CoWP capped Cu interconnects