Liu C‐h | Nan Jeon Inst. Of Technol. Yan‐hsui Twn
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概要
関連著者
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Liu C‐h
Nan Jeon Inst. Of Technol. Yan‐hsui Twn
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Su Y‐k
National Cheng Kung Univ. Tainan Twn
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CHANG Shoou-Jinn
Institute of Electro-Optical Science and Engineering, Center for Micro/Nano Science and Technology,
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SU Yan-Kuin
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
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LIU Chun-Hsing
Department of Electronic and Computering Engineering, Nan Jeon Institute of Technology
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Chang S‐j
Department Of Electrical Engineering National Cheng-kung University
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Lee Ming
United Microelectronics Corp.
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CHEN Jenkon
United Microelectronics Corp.
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Chang C‐s
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Chiang C‐i
Materials R&d Center Chung Shan Inst. Sci. & Technol. Taoyuan Twn
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Wann Clement
Ibm Microelectronics Division
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Rovedo Nivo
Ibm Microelectronics Division
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Yang Zhaohe
National Laboratory Of Crystal Materials And Institute Of Crystal Materials Shandong University
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LIU Chuan-Hsi
United Microelectronics Corp.
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LIN Chih-Yung
United Microelectronics Corp.
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SCHRUEFER Klaus
Infineon Technologies Corp.
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KATSETOS Anastasios
IBM Microelectronics Division
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YANG Zhijian
IBM Microelectronics Division
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HOOK Terence
IBM Microelectronics Division
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Yang Zuoya
Ibm Microelectronics Division
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Lan W‐h
Chung‐shan Inst. Sci. And Technol. Tao‐yuan Twn
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Chiou Y‐z
Department Of Electronics Engineering Southern Taiwan University Of Technology
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Lo Hsin-ming
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Chen S‐c
Industrial Technol. Res. Inst. Hsinchu Twn
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Chen Shih-chang
Advanced Module Technology Division Taiwan Semiconductor Manufacturing Company
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SHEI Shih-Chang
South Epitaxy Corporation
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CHANG Chia-Sheng
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
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LO Hsin-Ming
South Epitaxy Corporation
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CHANG Ping-Chuan
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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CHEN Chin-Hsiang
Department of Electronic Engineering, Cheng Shiu University
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CHEN Po-Chang
Department of Electronic and Computering Engineering, Nan Jeon Institute of Technology
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JHOU Yi-De
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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HUNG Hung
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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WANG Shih-Ming
Department of Electronic Engineering, National Yunlin University of Science and Technology
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CHIOU Yu-Zung
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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LIN Yi-Chao
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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HSU Yu-Pin
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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KE Jung-Chin
South Epitaxy Corporation
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CHEN Shih-Chih
Department of Electronic Engineering, National Yunlin University of Science and Technology
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CHEN Jone
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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LAN Wen-How
Chung-Shan Institute of Science & Technology
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LIN Wen-Jen
Chung Shan Institute of Science and Technology
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Dai Bau-tong
National Nano Device Laboratories
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Dai Bau-tong
National Nano Device Lab.
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Dai Bau-tong
National Nano Device Laboratory
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WEI Ta-Chin
Department of Chemical Engineering, Chung Yuan University
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LIU Chi-Hung
Department of Chemical Engineering, Chung Yuan University
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SHIEH Jia-Ming
National Nano Device Laboratory
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SUEN Shich-Chang
National Nano Device Laboratory
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Chen J
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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Chen S‐c
Advanced Module Technology Division Taiwan Semiconductor Manufacturing Company
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LIAW Uang-Heay
Department of Electronic Engineering, Chin-Min College
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Chen Jone
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Chen M‐h
National Cheng Kung Univ. Tainan Twn
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Wei Ta-chin
Department Of Chemical Engineering Chung Yuan University
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Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Shieh Jia-ming
National Nano Device Laboratories
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Liaw Uang-heay
Department Of Electronic Engineering Chin-min College
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LOH Y.T.
United Microelectronics Corp.
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LIOU Fu-Tai
United Microelectronics Corp.
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CHEN Tze-Chiang
IBM Microelectronics Division
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LIU Chuan
United Microelectronics Corp.
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SCHIML Thomas
Infineon Technologies Corp.
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CHENG Yao-Chin
United Microelectronics Corp.
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JUANG Fuh-Shyang
Department of Electro-Optics Engineering, National Formosa University
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Juang Fuh-shyang
Department Of Electro-optical Engineering National Huwei Institute Of Technology
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CHEN Wen-Ray
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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CHEN Ming-Hong
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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CHEN Ya-Tung
Chung Shan Institute of Science and Technology
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Cherng Y‐t
Chung‐shan Inst. Sci. And Technol. Tao‐yuan Twn
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Chen Wen-ray
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Liu Chun-hsing
Department Of Electronic Engineering Nan-jeon Institute Of Technology
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Su Yan-kuin
Institute Of Electro-optical Science And Engineering Advance Optoelectronics Technology Center Natio
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Lin Chin-Yung
United Microelectronics Corp.
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Suen Shich-Chang
National Nano Device Laboratories, Hsinchu 300, Taiwan, R.O.C.
著作論文
- InGaN/GaN Multi-Quantum Well Metal-Insulator Semiconductor Photodetectors with Photo-CVD SiO_2 Layers
- InGaN/GaN Light-Emitting Diodes with Rapidly Thermal-Annealed Ni/ITO p-Contacts
- Plasma Treatment and Dry Etch Characteristics of Organic Low-k Dielectrics
- Mechanism of Threshold Voltage Shift (ΔV_) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs
- Mechanism of Threshold Voltage Shift (ΔV_) Caused by Negative Bias Temperature Instability (NBTI) in Deep Sub-Micron pMOSFETs
- ZnMgSSe Metal-Semiconductor-Metal Visible-Blind Photodetectors with Transparent Indium-Tin-Oxide Contact Electrodes : Semiconductors
- A Decoupled Capacitance Measurement Technique for Characterization of Small-Geometry MOSFETs with Ultra-Thin Gate Oxides