Chen J | Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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- 同名の論文著者
- Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universitの論文著者
関連著者
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Chen J
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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Su Y‐k
National Cheng Kung Univ. Tainan Twn
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CHANG Shoou-Jinn
Institute of Electro-Optical Science and Engineering, Center for Micro/Nano Science and Technology,
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SU Yan-Kuin
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
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CHEN Jone
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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Chang S‐j
Department Of Electrical Engineering National Cheng-kung University
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Chen Jone
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Su Yan-kuin
Institute Of Electro-optical Science And Engineering Advance Optoelectronics Technology Center Natio
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Chang C‐s
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Lan W‐h
Chung‐shan Inst. Sci. And Technol. Tao‐yuan Twn
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Chiou Y‐z
Department Of Electronics Engineering Southern Taiwan University Of Technology
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Chang Chia-sheng
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Chiang C‐i
Materials R&d Center Chung Shan Inst. Sci. & Technol. Taoyuan Twn
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Chen J.
Department Of Systems Engineering And Naval Architecture National Taiwan Ocean University
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Wang Y.H.
Dept.of Materials Science and Engineeringn National Tsing Hua Univ.
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Chen J.
Department Of Electrical Engineering Da-yeh University
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Cho A
Department Of Electrical Engineering National Cheng-kung University
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Wang Yeong
Department Of Electronical Engineering National Cheng Kung University
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Liu Meng
Department Of Electrical Engineering National Cheng-kung University
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Houng Mau
Department Of Electrical Engineering National Cheng-kung University
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Cho Alfred
Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan, ROC
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Cherng Y‐t
Chung‐shan Inst. Sci. And Technol. Tao‐yuan Twn
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Chen J.
Department Of Civil Engineering National Chung-hsing University
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CHANG Chia-Sheng
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
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LIU Chun-Hsing
Department of Electronic and Computering Engineering, Nan Jeon Institute of Technology
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CHIOU Yu-Zung
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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LIN Yi-Chao
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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LIU Sen-Hai
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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CHEN Chin-Hsiang
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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KO Chih-Hsin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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KUAN Ta-Ming
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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CHIANG Chung-I
Materials R&D Center Chung Shan Institute of Science & Technology
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LAN Wen-How
Materials R&D Center Chung Shan Institute of Science & Technology
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LIN Wen-Jen
Materials R&D Center Chung Shan Institute of Science & Technology
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WEBB James
Institute for Microstructural Sciences, National Research Council
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HUANG Yao-Cong
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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WEBB Jim
Institute for Microstructural Sciences, National Research Council, Montreal Rd.
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LAN Wen-How
Chung-Shan Institute of Science & Technology
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Webb James
Institute For Microstructural Sciences National Research Council Montreal Rd.
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LIN Wen-Jen
Chung Shan Institute of Science and Technology
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Lin Yi-chao
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Liu C‐h
Nan Jeon Inst. Of Technol. Yan‐hsui Twn
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LIAW Uang-Heay
Department of Electronic Engineering, Chin-Min College
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Huang Yao-cong
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Chen M‐h
National Cheng Kung Univ. Tainan Twn
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Liu Sen-hai
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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Lan Wen-how
Material R&d Center Chung Shun Institute Of Science And Technology
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Lin Wen-jen
Material R&d Center Chung Shan Institute Of Science And Technology
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Ko Chih-hsin
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Kuan Ta-ming
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Liaw Uang-heay
Department Of Electronic Engineering Chin-min College
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Chen Nie
Department Of Electrophysics National Chiao Tung University
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CHEN Jenn
Department of Electrophysics, National Chiao Tung University
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WANG Pai
Department of Electrophysics, National Chiao Tung University
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JUANG Fuh-Shyang
Department of Electro-Optics Engineering, National Formosa University
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Juang Fuh-shyang
Department Of Electro-optical Engineering National Huwei Institute Of Technology
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CHEN Wen-Ray
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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CHEN Ming-Hong
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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CHEN Ya-Tung
Chung Shan Institute of Science and Technology
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Wang Pai
Department Of Electrophysics National Chiao Tung University
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Chen Wen-ray
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Liu Chun-hsing
Department Of Electronic Engineering Nan-jeon Institute Of Technology
著作論文
- Transparent TiN Electrodes in GaN Metal-Semiconductor-Metal Ultraviolet Photodetectors(Semiconductors)
- On the Carrier Concentration and Hall Mobility in GaN Epilayers : Semiconductors
- Effects of High-Resistivity, Low-Temperature Layer in Transient Capacitance Measurements of GaAs n-i-p Structures
- ZnMgSSe Metal-Semiconductor-Metal Visible-Blind Photodetectors with Transparent Indium-Tin-Oxide Contact Electrodes : Semiconductors
- The Low-Temperature Characteristics of GaSb/AlSb/InAs/GaSb/AlSb/InAs Broken-Gap Interband Tunneling Structures
- The Low-Temperature Characteristics of GaSb/AlSb/InAs/GaSb/AlSb/InAs Broken-Gap Interband Tunneling Structure