Chen S‐c | Industrial Technol. Res. Inst. Hsinchu Twn
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概要
関連著者
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Chen S‐c
Industrial Technol. Res. Inst. Hsinchu Twn
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Chen Shih-chang
Advanced Module Technology Division Taiwan Semiconductor Manufacturing Company
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Su Y‐k
National Cheng Kung Univ. Tainan Twn
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CHANG Shoou-Jinn
Institute of Electro-Optical Science and Engineering, Center for Micro/Nano Science and Technology,
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Liang M‐s
Taiwan Semiconductor Manufacturing Co. Hsinchu Twn
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SU Yan-Kuin
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
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LIU Chun-Hsing
Department of Electronic and Computering Engineering, Nan Jeon Institute of Technology
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CHEN Mao-Chieh
Department of Electronics Engineering & The Institute of Electronics, National Chiao Tung University
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Chen S‐c
Advanced Module Technology Division Taiwan Semiconductor Manufacturing Company
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Chang S‐j
Department Of Electrical Engineering National Cheng-kung University
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Wu Wei-hao
Department Of Electronics Engineering National Chiao Tung University
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Chang C‐s
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Lo Hsin-ming
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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SHEI Shih-Chang
South Epitaxy Corporation
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CHANG Chia-Sheng
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
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LO Hsin-Ming
South Epitaxy Corporation
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CHIOU Yu-Zung
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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LIN Yi-Chao
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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HSU Yu-Pin
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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KE Jung-Chin
South Epitaxy Corporation
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CHEN Shih-Chih
Department of Electronic Engineering, National Yunlin University of Science and Technology
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Chiang C‐i
Materials R&d Center Chung Shan Inst. Sci. & Technol. Taoyuan Twn
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Chen Mao-chieh
Department Of Electronics Engineering National Chiao Tung University
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TSUI Bing-Yue
Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University
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LIANG Mong-Song
Taiwan Semiconductor Manufacturing Co., Ltd.
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Liang Mong-song
Advanced Module Technology Division Taiwan Semiconductor Manufacturing Company
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Liang Mong-song
Taiwan Semiconductor Manufacturing Company
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HOU Yong-Tian
Advanced Module Technology Division, Taiwan Semiconductor Manufacturing Company
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JIN Yin
Advanced Module Technology Division, Taiwan Semiconductor Manufacturing Company
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TAO Hun-Jan
Advanced Module Technology Division, Taiwan Semiconductor Manufacturing Company
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Tsui Bing-yue
Department Of Electronics Engineering National Chiao Tung University
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Tsui Bing-yue
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung University
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Liu C‐h
Nan Jeon Inst. Of Technol. Yan‐hsui Twn
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Jin Yin
Advanced Module Technology Division Taiwan Semiconductor Manufacturing Company
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Tao Hun-jan
Advanced Module Technology Division Taiwan Semiconductor Manufacturing Company
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Hou Yong-tian
Advanced Module Technology Division Taiwan Semiconductor Manufacturing Company
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HSU Wei-Cheng
Department of Electronics Engineering, National Chiao Tung University
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CHEN Shih-Chang
Taiwan Semiconductor Manufacturing Company, Science-Based Industrial Park
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WEI Sun-Chin
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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CHEN Shih-Chih
2Institute of Electronics and Information Engineering, National Yunlin University of Science and Tec
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LIAW Uang-Heay
Department of Electronic Engineering, Chin-Min College
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TSAI Tzong-Yow
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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HSU Tzu-Hsuan
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University
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Wu Wei-hao
Department Of Electronics Engineering And Institute Of Electronics National Chiao-tung University
著作論文
- InGaN/GaN Light-Emitting Diodes with Rapidly Thermal-Annealed Ni/ITO p-Contacts
- Threshold Voltage Instability in nMOSFETs with HfSiO/SiO_2 High-k Gate Stacks
- Annealing Effect on Boron High-Energy-Ion-Implantation-Induced Defects in Si
- AlGaN/GaN Modulation-Doped Field-Effect Transistors with An Mg-doped Carrier Confinement Layer