Ikari A | Wacker Nsce Corp. Yamaguchi Jpn

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著作論文

Influence of Atmosphere on Molten Silicon Density
Temperature Dependence of the Electrical Resistivity of Molten Silicon
Positron Annihilation in Proton Irradiated Czochralski-Grown Si
Oxygen Microclusters in Czochralski-Grown Si Probed by Positron Annihilation
Defects in Czochralski-Grown Silicon Crystals Investigated by Positron Annihilation
Crystal Defects in Epitaxial Layer on Nitrogen-doped Czochralski-grown Silicon Substrate (II) : Suppression of the Crystal Defects in Epitaxial Layer by the Control of Crystal Growth Condition and Carbon Co-doping
Crystal Defects in Epitaxial Layer on Nitrogen-doped Czochralski-grown Silicon Substrate (I) : Investigation of the Crystallographic Structure
In Situ Observation of Etching Processes of Silica Glasses by Silicon Melts
Oxygen Clusters in Quenched Czochralski-Si Studied by Infrared Spectroscopy and Positron Annihilation

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