Sasaki H | Semiconductor Group Mitsubishi Electric Corporation

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著作論文

Effect of Impurity Doping on Density Anomalies in Molten Silicon
Influence of Atmosphere on Molten Silicon Density
Temperature Dependence of the Viscosity of Molten Silicon Measured by the Oscillating Cup Method
Temperature Dependence of the Electrical Resistivity of Molten Silicon
Effect of Gallium Addition on Density Variation of Molten Silicon
Surface Tension Variation of Molten Silicon Measured by the Ring Method
Density Variations in Molten Silicon Dependent on Its Thermal History
Density Variation of Molten Silicon Measured by an Improved Archimedian Method
Analysis of Deposits Evaporated frorm Sb-Doped Si Melts
Evaporation of Oxygen-Bearing Species from Si Melt and Influence of Sb Addition
Oxygen Solubilities in Si Melt : Influence of Sb Addition
High Recording Density Optical Disc Mastering
Microscopic Analysis of the Degradation Mechanism of Gallium Arsenide Metal-Semiconductor Field-Effect Transistor
Light Emission and Surface States Annealing on GaAs Metal Semiconductor Field-Effect Transistor
Decrease in Surface States on GaAs Metal-Semiconductor Field-Effect Transistor by High Temperature Operation
Investigation of Substrate-dependent Characteristics of SnO_2 Thin Films with Hall Effect, X-Ray Diffraction, X-Ray Photoelectron Spectroscopy and Atomic Force Microscopy Measurements
Analysis of Surface States of Gallium Arsenide Metal Semiconductor Field-Effect Transistors using Drain Current Transients under Light Illumination
Analysis of Gate Lag in GaAs Metal-Semiconductor Field-Effect Transistor Using Light Illumination
Prebake Effects in Chemical Amplification Electron-Beam Resist : Resist and Processes
Prebake Effects in Chemical Amplification Electron-Beam Resist

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