Ishihara Osamu | Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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概要
関連著者
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Ishihara Osamu
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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Ishihara Osamu
Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corp.
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Ishihara O
Mitsubishi Electric Corp. Itami‐shi Jpn
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Ishihara O
Department Of Physics Faculty Of Engineering Yokohama National University
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OHTA Akira
Faculty of Science, Shinshu University
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Kamon Kazuya
Ulsi Laboratory Mitsubishi Electric Corporation
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Kamon Kazuya
Ulsi Laboratory Mitsubishi Electric Corp.
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YOSHIDA Naohito
Optoelectronic and Microwave Devices R&D Laboratory, Mitsubishi Electric Corporation
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Minami Hiroyuki
Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation
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KASHIWA Takuo
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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KATOH Takayuki
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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KITANO Toshiaki
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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TANINO Noriyuki
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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TAKAGI Tadashi
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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Yamamoto Yoshitsugu
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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Sonoda Takuji
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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Takano Hirozo
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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Ohta A
Mitsubishi Electric Corp. Itami‐shi Jpn
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SHIMADA Masaaki
Optoelectronic amp Microwave Devices Laboratory, Mitsubishi Electric Corporation
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HIGASHISAKA Norio
Optoelectronic amp Microwave Devices Laboratory, Mitsubishi Electric Corporation
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OHTA Akira
Optoelectronic amp Microwave Devices Laboratory, Mitsubishi Electric Corporation
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HOSOGI Kenji
Optoelectronic amp Microwave Devices Laboratory, Mitsubishi Electric Corporation
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KUBO Kazuo
Information Technology R amp D Center, Mitsubishi Electric Corporation
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HIDANI Fuminobu
Information Technology R amp D Center, Mitsubishi Electric Corporation
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Takagi T
Optical Interconnection Sumiden Laboratory Rwcp
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YAMAMOTO Yoh
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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Katoh T
Nippon Leiz Co. Ltd. Tama‐shi Jpn
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Katoh Takayuki
High Frequency & Optical Semiconductor Div. Mitsubishi Electric Corporation
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Ando K
Toyota Technological Institute
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Sasaki Hajime
Semiconductor Group Mitsubishi Electric Corporation
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KONISHI Ryosuke
Faculty of Engineering, Tottori University
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ANDO Koshi
Faculty of Engineering, Tottori University
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SASAKI Hajime
Microwave & Optical Device Reliability Engineering Section, Semiconductor Group, Mitsubishi Electric
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MATSUBAYASHI Hiroto
Optoelectronic & Microwave Devices Laboratory, Mitsubishi Electric Corporation
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Katoh Takayuki
Optoelectronic And Microwave Devices Laboratory
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Sasaki Hideyuki
R&d Center Toshiba Corp.
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Yamamoto Yoshitsugu
Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation
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Ishihara Osamu
Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corporation
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Minami Hiroyuki
Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corp.
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Sasaki H
Semiconductor Group Mitsubishi Electric Corporation
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Sasaki H
Electrotechnical Laboratory
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Ando K
Department Of Electrical And Electronic Engineering Tottori University
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Minami H
Ntt Corp. Musashino‐shi Jpn
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Takagi T
Research Institute Of Electrical Communication Tohoku University
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Kubo K
Mitsubishi Electric Corp. Kamakura‐shi Jpn
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Kubo Kazuo
Pharmaceutical Research Laboratories Pharmaceutical Division Kirin Brewery Co. Ltd.
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Hosogi Kenji
Optoelectronic Amp Microwave Devices Laboratory Mitsubishi Electric Corporation
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Kashiwa Takuo
High Frequency & Optical Semiconductor Div. Mitsubishi Electric Corporation Department Of Physic
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Sonoda Takuji
Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation
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Sonoda Takuji
Optoelectronic & Microwave Devices Lab. Mitsubishi Electric Corporation
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Kojima Yoshiki
Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corp.
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Shimada M
Nasda Minato‐ku Jpn
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Hidani Fuminobu
Information Technology R Amp D Center Mitsubishi Electric Corporation
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Tanino N
Mitsubishi Electric Corp. Itami‐shi Jpn
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Tanino Noriyuki
Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation
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NAKATANI Mitsunori
Optoelectronic & Microwave Devices Laboratory, Mitsubishi Electric Corp.
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NAKANO Hirofumi
Optoelectronic & Microwave Devices Laboratory, Mitsubishi Electric Corp.
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SATO Kazuhiko
Optoelectronic & Microwave Devices Laboratory, Mitsubishi Electric Corp.
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TAKANO Hirozou
Optoelectronic & Microwave Devices Laboratory, Mitsubishi Electric Corp.
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Takano Hirozou
Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corp.
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Yoshida N
Mitsubishi Electric Corp. Itami‐shi Jpn
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Yoshida Naohito
Optoelectronic And Microwave Devices R&d Laboratory Mitsubishi Electric Corporation
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Takano H
Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation
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Nakatani Mitsunori
Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corp.
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Nakano Hirofumi
Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corp.
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Konishi R
Tottori Univ. Tottori
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Konishi Ryosuke
Department Of Electrical And Electronic Engineering Tottori University
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Higashisaka N
Mitsubishi Electric Corp. Itami‐shi Jpn
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Sato Kazuhiko
Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corp.
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Matsubayashi Hiroto
Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corporation
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Yoshida Naohito
Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation
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Tanino Noriyuki
Optoelectronic amp Microwave Devices Laboratory, Mitsubishi Electric Corporation
著作論文
- A Super Low Noise AlInAs/InGaAs HEMT Fabricated by Selective Gate Recess Etching
- GaAs 10 Gb/s 64:1 Multiplexer/Demultiplexer Chip Sets (Special Issue on Ultra-High-Speed LSIs)
- Analysis of Gate Lag in GaAs Metal-Semiconductor Field-Effect Transistor Using Light Illumination
- Effect of Lens Aberration on Resist Pattern Profiles in Edge-Line Phase-Shift Method