OSAKI Tomoyuki | Faculty of Engineering, Tottori University
スポンサーリンク
概要
関連著者
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YEA Byeongdeok
Faculty of Engineering, Tottori University
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OSAKI Tomoyuki
Faculty of Engineering, Tottori University
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SUGAHARA Kazunori
Faculty of Engineering, Tottori University
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KONISHI Ryosuke
Faculty of Engineering, Tottori University
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Yea Byeongdeok
Korea Maritime University
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Osaki T
Department Of Electrical And Electronic Engineering Tottori University
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Sugahara Kazunori
Department Of Information And Knowledge Engineering Tottori University
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Konishi Ryosuke
Department Of Electrical And Electronic Engineering Tottori University
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Sasaki Hajime
Semiconductor Group Mitsubishi Electric Corporation
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Sasaki Hideyuki
R&d Center Toshiba Corp.
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Sasaki H
Semiconductor Group Mitsubishi Electric Corporation
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Sasaki H
Electrotechnical Laboratory
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Mizuguchi Kiyoshi
Semiconductor Group Mitsubishi Electric Corporation
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Mizuguchi K
Semiconductor Group Mitsubishi Electric Corporation
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Hayashi K
Kyoto Univ. Kyoto Jpn
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Hayashi Kouichi
Department Of Materials Science And Engineering Kyoto University
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HAYASHI Ken-ichi
Keio University
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HAYASHI Kazuo
Semiconductor Group, Mitsubishi Electric Corporation
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FUJIOKA Takashi
Semiconductor Group, Mitsubishi Electric Corporation
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Hayashi Kunihiko
Superconductivity Research Laboratory International Superconductivity Technology Center
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Hayashi Katsuro
Frontier Collaborative Research Center Tokyo Institute Of Technology
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SASAKI Hajime
Faculty of Engineering, Tottori University
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Hayashiguchi Youichi
Faculty Of Engineering Tottori University
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Ando K
Toyota Technological Institute
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ABE Masayuki
Semiconductor Group, Mitsubishi Electric Corporation
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KASADA Hirofumi
Faculty of Engineering, Tottori University
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ANDO Koshi
Faculty of Engineering, Tottori University
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HAYASHIGUCHI Youichi
Faculty of Engineering, Tottori University
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Abe Masayuki
Semiconductor Group Mitsubishi Electric Corporation
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Ando K
Department Of Electrical And Electronic Engineering Tottori University
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Kasada Hirofumi
Faculty Of Engineering Tottori University
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Yea Byeongdeok
Faculty of Engineering, Tottori University, 4-101 Koyama, Tottori 680-8552, Japan
著作論文
- Microscopic Analysis of the Degradation Mechanism of Gallium Arsenide Metal-Semiconductor Field-Effect Transistor
- Light Emission and Surface States Annealing on GaAs Metal Semiconductor Field-Effect Transistor
- Decrease in Surface States on GaAs Metal-Semiconductor Field-Effect Transistor by High Temperature Operation
- Analysis of Surface States of Gallium Arsenide Metal Semiconductor Field-Effect Transistors using Drain Current Transients under Light Illumination
- The Periodic Operation of a Semiconductor Gas Sensor and Its Application to the Discrimination of Inflammable Gases
- Analysis of Surface States of Gallium Arsenide Metal Semiconductor Field-Effect Transistors using Drain Current Transients under Light Illumination