Iiyama K | Graduate School Of Natural Science And Technology Kanazawa University
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概要
- IIYAMA Koichiの詳細を見る
- 同名の論文著者
- Graduate School Of Natural Science And Technology Kanazawa Universityの論文著者
関連著者
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Iiyama K
Graduate School Of Natural Science And Technology Kanazawa University
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TAKAMIYA Saburo
Graduate School of Natural Science and Technology, Kanazawa University
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Takamiya S
Graduate School Of Natural Science And Technology Kanazawa University
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IIYAMA Koichi
Graduate School of Natural Science and Technology, Kanazawa University
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Seto Hiroki
Graduate School Of Natural Science And Technology Kanazawa University
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Takamiya S
Kanazawa Univ. Ishikawa Jpn
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Takamiya Saburo
The Department Of Electrical And Computer Engineering Faculty Of Engineering Kanazawa University
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Inokuma Takao
Graduate School Of Natural Science And Technology Kanazawa University
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Inokuma Takao
Department Of Electronics Kanazawa University
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SETO Hiroki
Graduate School of Natural Science and Technology, Kanazawa University
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Takamiya Saburo
Graduate School Of Natural Science And Technology Division Of Electrical Engineering And Computer Sc
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MIYAMURA Satoshi
Graduate School of Natural Science and Technology, Kanazawa University
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Kasai Yuhki
Graduate School Of Natural Science And Technology Kanazawa University
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Kita Yoshiaki
Hitachi Research Laboratory Hitachi Ltd.
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Kasai Yuuki
Graduate School Of Natural Science And Technology Kanazawa University
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Kita Yutaro
Graduate School Of Natural Science And Technology Kanazawa University
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IIYAMA Koichi
Department of Electrical and Computer Engineering, Faculty of Engineering, Kanazwa University
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PAUL Narayan
Graduate School of Natural Science and Technology, Kanazawa University
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NAKAMURA Kazuki
Graduate School of Natural Science and Technology, Kanazawa University
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TSUZUKU Tatsutoshi
Graduate School of Natural Science and Technology, Kanazawa University
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Fujino Yuhki
Graduate School Of Natural Science And Technology Kanazawa University
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IIYAMA Kouichi
Graduate School of Natural Science and Technology, Kanazawa University
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Sugimura Tomoyuki
Gradiate School Of Natural Science And Technology Kanazawa University
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Tsuzuku Tatsutoshi
Graduate School Of Natural Science And Technology Kanazawa University
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Hisaka Takayuki
High Frequency & Optical Device Works, Mitsubishi Electric Corporation
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Zhou X‐q
Department Of Electrical And Computer Engineering Faculty Of Engineering Kanazwa University
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ZHOU Xiao-qun
Department of Electrical and Computer Engineering, Faculty of Engineering, Kanazwa University
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HAYASHI Ken-ichi
Department of Electrical and Computer Engineering, Faculty of Engineering, Kanazwa University
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Iiyama K
Kanazawa Univ. Kanazawa‐shi Jpn
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YONEZAWA Yasuto
Industrial Research Institute of Ishikawa (IRII)
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Zhou Xiao-qun
Department Of Electrical And Computer Engineering Faculty Of Engineering Kanazwa University
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Inokuma Takao
Gradiate School Of Natural Science And Technology Kanazawa University
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KASAI Yuhki
Research and Development Center, Electronic and Plastic Materials Company, Matsushita Electric Works
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YAMAMURA Youichi
Graduate School of Natural Science and Technology, Kanazawa University
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TAKEBE Masahide
Graduate School of Natural Science and Technology, Kanazawa University
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TAKEMOTO Akira
Graduate School of Natural Science and Technology, Kanazawa University
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HIGASHIMINE Koichi
Japan Advanced Institute of Science and Technology
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OHTSUKA Nobuo
Japan Advanced Institute of Science and Technology
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SUGIMURA Tomoyuki
Gradiate School of Natural Science and Technology, Kanazawa University
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KASAI Yuuki
Gradiate School of Natural Science and Technology, Kanazawa University
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IIYAMA Kouichi
Gradiate School of Natural Science and Technology, Kanazawa University
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TAKAMIYA Saburo
Gradiate School of Natural Science and Technology, Kanazawa University
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Nakamura Kazuki
Graduate School Of Natural Science And Technology Kanazawa University
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FUJINO Yuhki
Graduate School of Natural Science and Technology, Kanazawa University
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TOTSUKA Masahiro
High Frequency and Optoelectronic Devices Works, Mitsubishi Electric Co., Ltd.
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AIHARA Yasuki
High Frequency and Optoelectronic Devices Works, Mitsubishi Electric Co., Ltd.
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ASHIDA Junya
Graduate School of Natural Science and Technology, Kanazawa University
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TAKEMOTO Akira
Mitsubishi Electric Corporation
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Aihara Yasuki
High Frequency And Optoelectronic Devices Works Mitsubishi Electric Co. Ltd.
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Totsuka Masahiro
High Frequency And Optoelectronic Devices Works Mitsubishi Electric Co. Ltd.
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KITA Yukihiro
Graduate School of Natural Science and Technology, Kanazawa University
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HASHIMOTO Shoushin
Graduate School of Natural Science and Technology, Kanazawa University
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SUGIMURA Tomoyuki
Graduate School of Natural Science and Technology, Kanazawa University
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Hashimoto Shoushin
Graduate School Of Natural Science And Technology Kanazawa University
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Ashida Junya
Graduate School Of Natural Science And Technology Kanazawa University
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Paul Narayan
Graduate School Of Natural Science And Technology Kanazawa University
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Kita Yukihiro
Graduate School Of Natural Science And Technology Kanazawa University
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Takemoto Akira
Hf & Optical Semiconductor Division Mitsubishi Electric Corporation
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Hayashi K
Kyushu Univ. Fukuoka‐shi Jpn
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Hayashi Ken-ichi
Department Of Applied Aquabiology National Fisheries University
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Iiyama Koichi
Graduate School Of Natural Science And Technology Division Of Electrical Engineering And Computer Sc
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Iiyama Koichi
Graduate School Of Natural Science And Technology Kanazawa University
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Iiyama Koichi
Department Of Electrical And Electronic Engineering Faculty Of Engineering Kanazawa University
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Nakamura Kazuki
Graduate School Of Advanced Integration Science Chiba University
著作論文
- Effect of Laser Phase-Induced Intensity Noise on Multiplexed Fiber-Optic Sensor System Using Optical Loop with Frequency Shifter
- Mechanical Stress Caused by Adsorption of O or N on Ga-terminated (100) GaAs Surface and InAl-terminated (100) InAlAs Surface : Degradation of Insulator/Semiconductor Interface
- Studies of Effects of Adsorption of Silicon or Germanium on the Electronic States of (100) GaAs Surfaces
- Oxygen and Sulfur Adsorption Effects on Electronic States of GaAs(100) Surfaces Studied with Discrete Variational Xα Method
- Structural and Electrical Characterization of Oxidated, Nitridated and Oxi-nitridated (100) GaAs Surfaces
- Two Levels of Ni/n-GaAs Schottky Barrier Heights Formed on a Wafer by Controlling pH of Pretreatment Chemicals : Effect of Oxygen Adsorption
- Effect of Oxidation using Ultraviolet Light and Ozone and Subsequent Nitridation using Electron Cyclotron Resonance Plasma on Gate Portion of GaAs Field-Effect Transistors
- Effect of Oxidation using Ultraviolet Light and Ozone and Subsequent Nitridation using Electron Cyclotron Resonance Plasma on Gate Portion of GaAS Field-Effect Transistors
- Oxidation of InAlAs and Its Application to Gate Insulator of InAlAs/InGaAs Metal Oxide Semiconductor High Electron Mobility Transistor
- Equivalent Circuit Model of InAlAs/InGaAs/InP Heterostructure Metal-Semiconductor-Metal Photodetectors(Lasers, Quantum Electronics)
- Application of Brightness of Scanning Electron Microscope Images to Measuring Thickness of Nanometer-Thin SiO_2 Layers on Si Substrates : Semiconductors
- I-V Characteristics of Schottky/Metal-Insulator-Semiconductor Diodes with Tunnel Thin Barriers