Takamiya S | Kanazawa Univ. Ishikawa Jpn
スポンサーリンク
概要
関連著者
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TAKAMIYA Saburo
Graduate School of Natural Science and Technology, Kanazawa University
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Takamiya S
Graduate School Of Natural Science And Technology Kanazawa University
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Takamiya S
Kanazawa Univ. Ishikawa Jpn
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Takamiya Saburo
The Department Of Electrical And Computer Engineering Faculty Of Engineering Kanazawa University
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Iiyama K
Graduate School Of Natural Science And Technology Kanazawa University
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Takamiya Saburo
Graduate School Of Natural Science And Technology Division Of Electrical Engineering And Computer Sc
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Kasai Yuhki
Graduate School Of Natural Science And Technology Kanazawa University
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Kita Yoshiaki
Hitachi Research Laboratory Hitachi Ltd.
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Kasai Yuuki
Graduate School Of Natural Science And Technology Kanazawa University
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Kita Yutaro
Graduate School Of Natural Science And Technology Kanazawa University
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TSUZUKU Tatsutoshi
Graduate School of Natural Science and Technology, Kanazawa University
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IIYAMA Kouichi
Graduate School of Natural Science and Technology, Kanazawa University
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Sugimura Tomoyuki
Gradiate School Of Natural Science And Technology Kanazawa University
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Tsuzuku Tatsutoshi
Graduate School Of Natural Science And Technology Kanazawa University
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MAEDA Takahiro
the Department of Haematology of Atomic Disease Institute, Nagasaki University School of Medicine
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IIYAMA Koichi
Department of Electrical and Computer Engineering, Faculty of Engineering, Kanazwa University
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Inokuma Takao
Gradiate School Of Natural Science And Technology Kanazawa University
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SETO Hiroki
Graduate School of Natural Science and Technology, Kanazawa University
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IIYAMA Koichi
Graduate School of Natural Science and Technology, Kanazawa University
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PAUL Narayan
Graduate School of Natural Science and Technology, Kanazawa University
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NAKAMURA Kazuki
Graduate School of Natural Science and Technology, Kanazawa University
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SUGIMURA Tomoyuki
Gradiate School of Natural Science and Technology, Kanazawa University
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KASAI Yuuki
Gradiate School of Natural Science and Technology, Kanazawa University
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IIYAMA Kouichi
Gradiate School of Natural Science and Technology, Kanazawa University
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TAKAMIYA Saburo
Gradiate School of Natural Science and Technology, Kanazawa University
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Seto Hiroki
Graduate School Of Natural Science And Technology Kanazawa University
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Nakamura Kazuki
Graduate School Of Natural Science And Technology Kanazawa University
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ASHIDA Junya
Graduate School of Natural Science and Technology, Kanazawa University
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TAKEMOTO Akira
Mitsubishi Electric Corporation
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Maeda Takahiro
The Department Of Electrical And Computer Engineering Faculty Of Engineering Kanazawa University
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KITA Yukihiro
Graduate School of Natural Science and Technology, Kanazawa University
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HASHIMOTO Shoushin
Graduate School of Natural Science and Technology, Kanazawa University
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SUGIMURA Tomoyuki
Graduate School of Natural Science and Technology, Kanazawa University
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Hashimoto Shoushin
Graduate School Of Natural Science And Technology Kanazawa University
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Ashida Junya
Graduate School Of Natural Science And Technology Kanazawa University
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Paul Narayan
Graduate School Of Natural Science And Technology Kanazawa University
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Kita Yukihiro
Graduate School Of Natural Science And Technology Kanazawa University
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Takemoto Akira
Hf & Optical Semiconductor Division Mitsubishi Electric Corporation
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Iiyama Koichi
The Department Of Electrical And Computer Engineering Faculty Of Engineering Kanazawa University
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Iiyama Koichi
Graduate School Of Natural Science And Technology Division Of Electrical Engineering And Computer Sc
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Iiyama Koichi
Graduate School Of Natural Science And Technology Kanazawa University
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Iiyama Koichi
Department Of Electrical And Electronic Engineering Faculty Of Engineering Kanazawa University
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Nakamura Kazuki
Graduate School Of Advanced Integration Science Chiba University
著作論文
- Two Levels of Ni/n-GaAs Schottky Barrier Heights Formed on a Wafer by Controlling pH of Pretreatment Chemicals : Effect of Oxygen Adsorption
- Oxidation of InAlAs and Its Application to Gate Insulator of InAlAs/InGaAs Metal Oxide Semiconductor High Electron Mobility Transistor
- Equivalent Circuit Model of InAlAs/InGaAs/InP Heterostructure Metal-Semiconductor-Metal Photodetectors(Lasers, Quantum Electronics)
- Application of Brightness of Scanning Electron Microscope Images to Measuring Thickness of Nanometer-Thin SiO_2 Layers on Si Substrates : Semiconductors
- I-V Characteristics of Schottky/Metal-Insulator-Semiconductor Diodes with Tunnel Thin Barriers
- Phase-Decorrelated FMCW Reflectometry for Long Optical Fiber Characterization by Using a Laser Diode with Modulated External-Cavity (Special Issue on Optical Fiber Sensors)