HIGASHI Seiichiro | Base Technology Research Center, Seiko Epson Corp.
スポンサーリンク
概要
関連著者
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HIGASHI Seiichiro
Base Technology Research Center, Seiko Epson Corp.
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SAMESHIMA Toshiyuki
Department of Electrical and Electric Engineering, Tokyo University of Agriculture and Technology
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Sameshima T
Tokyo Univ. Agriculture And Technol. Koganei Jpn
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井上 聡
セイコーエプソン株式会社フロンティアデバイス研究所
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Abe Daisuke
Frontier Device Research Center Seiko Epson Corporation
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ABE Daisuke
Base Technology Research Center, Seiko Epson Corp.
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INOUE Satoshi
Base Technology Research Center, Seiko Epson Corp.
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SHIMODA Tatsuya
Base Technology Research Center, Seiko Epson Corp.
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Shimoda Tatsuya
Seiko Epson Corp. Nagano Jpn
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Ando Nobuyuki
Base Technology Research Center Seiko Epson Corp.
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Ando Nobuyuki
Department Of Food Science And Technology Faculty Of Agriculture Kyoto University
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Ando Nobuyuki
Department Of Applied Chemistry Faculty Of Engineering Chiba University
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Shimoda Tatsuya
Base Technology Research Center Seiko Epson Corporation
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Inoue S
Seiko Epson Corporation
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KAMISAKO Koichi
Department of Engineering, Tokyo University of Agriculture and Technology
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Higashi S
Seiko Epson Corporation Technology Platform Research Center
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下田 達也
Seiko Epson Corporation
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Sameshima Toshiyuki
Department of Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei, Tokyo 184-8588, Japan
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Kamisako Koichi
Department of Electrical and Information Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Nakamachi, Koganei, Tokyo 184-8588, Japan
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Kamisako Koichi
Department of Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei, Tokyo 184-8588, Japan
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Higashi Seiichiro
Base Technology Research Center, Seiko Epson Corp., 3-3-5 Owa, Suwa, Nagano 392-8502, Japan
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Ando Nobuyuki
Department of Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei, Tokyo 184-8588, Japan
著作論文
- Low-Temperature Formation of Device-Quality SiO_2/Si Interfaces Using Electron Cyclotron Resonance Plasma-Enhanced Chemical Vapor Deposition
- Pulsed-Laser-Induced Microcrystallization and Amorphization of Silicon Thin Films
- Stress in Pulsed-Laser-Crystallized Silicon Films
- Stress in Pulsed-Laser-Crystallized Silicon Films
- Pulsed-Laser-Induced Microcrystallization and Amorphization of Silicon Thin Films