Cho B | National Univ. Singapore Sgp
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概要
関連著者
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Cho B
National Univ. Singapore Sgp
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Cho Byung
Department Of Electrical And Computer Engineering National University Of Singapore
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Yeo I
Hyundai Electronics Ind. Co. Ltd. Kyungki‐do Kor
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Yeo In
Hyundai Electronics Industries Company Limited Semiconductor Advanced Research Division
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Joo Moon
Hyundai Electronics Industries Company Limited Semiconductor Advanced Research Division
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Cho Byung
Department Of Eecs Kaist
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Joo Moon
Hyundai Electronics Industries Company Limited Memory R&d Division
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Yeo In
Hyundai Electronics Industries Company Limited Memory R&d Division
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JOO Moon
Hyundai Electronics Ind. Co. Ltd. Memory R&D Division
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YEO In
Hyundai Electronics Ind. Co. Ltd. Memory R&D Division
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Kim Sun
Department Of Chemical Engineering Sogang University
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Chor E
National Univ. Singapore Singapore
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ANG Chew
Department of Electrical and Computer Engineering, National University of Singapore
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LING Chung
Department of Electrical and Computer Engineering, National University of Singapore
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CHONG Pei
Department of Electrical Engineering, National University of Singapore
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CHOR Eng
Department of Electrical Engineering, National University of Singapore
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Ling C
Department Of Electrical And Computer Engineering National University Of Singapore
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Chor Eng
Department Of Electrical Engineering National University Of Singapore
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Chong Pei
Department Of Electrical Engineering National University Of Singapore
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Chong Pei
Department Of Biomedical Sciences Faculty Of Medicine Health And Sciences University Putra Malaysia
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Joo Moon
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Cho Byung
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Kwong Dim-lee
Department Of Electrical And Computer Engineering The University Of Texas
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Kwong Dim-lee
Department Of Ece The University Of Texas
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WU Nan
Silicon Nano Device Laboratory, Department of Electrical and Computer Engineering, National Universi
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ZHU Chunxiang
Silicon Nano Device Laboratory, Department of Electrical and Computer Engineering, National Universi
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CHIM Wai
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute
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Yue Jeffrey
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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Ang Chew
Department Of Electrical And Computer Engineering National University Of Singapore
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CHO Byung
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute
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Balasubramanian Narayanan
Institute Of Microelectronics
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Li Ming
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Wu Nan
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Chim Wai
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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Zhu Chunxiang
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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YEO Chia
Silicon Nano Device Lab (SNDL), Department of Electrical and Computer Engineering, National Universi
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YU Hongyu
Silicon Nano Device Lab (SNDL), Department of Electrical and Computer Engineering, National Universi
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Kim Sun
Department Of Applied Chemistry Faculty Of Engineering Osaka University
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Yeo Chia
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Yu H
Univ. California Ca Usa
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Ang Chew
Department Of Electrical Engineering National University Of Singapore
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Ling Chung
Department Of Electrical Engineering National University Of Singapore
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Kim Sun
Department Of Electrical Engineering National University Of Singapore
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Kim Sun
Department Of Animal Science And Technology Seoul National University
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Yue Jeffery
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Computer Engineering, National University of Singapore
著作論文
- Reliability of Thin Gate Oxides Irradiated under X-Ray Lithography Conditions
- Gate Oxide Reliability Concern Associated with X-Ray Lithography
- Investigation of Reliability Degradation of Ultra-Thin Gate Oxides Irradiated under Electron-Beam Lithography Conditions
- Intergrity of Gate Oxides Irradiated Under Electron-Beam Lithography Conditions
- Hot-Carrier Lifetime Dependence on Channel Width and Silicon Recess Depth in N-Channel Metal-Oxide-Semiconductor Field-Effect-Transistors with the Recessed Local Oxidation of Silicon Isolation Structure(Semiconductors)
- Dependence of Chemical Composition Ratio on Electrical Properties of HfO_2-Al_2O_3 Gate Dielectric