CHOR Eng | Department of Electrical Engineering, National University of Singapore
スポンサーリンク
概要
関連著者
-
CHOR Eng
Department of Electrical Engineering, National University of Singapore
-
Chor Eng
Department Of Electrical Engineering National University Of Singapore
-
Yeo I
Hyundai Electronics Ind. Co. Ltd. Kyungki‐do Kor
-
Yeo In
Hyundai Electronics Industries Company Limited Semiconductor Advanced Research Division
-
Cho B
National Univ. Singapore Sgp
-
Cho Byung
Department Of Eecs Kaist
-
Cho Byung
Department Of Electrical And Computer Engineering National University Of Singapore
-
Joo Moon
Hyundai Electronics Industries Company Limited Semiconductor Advanced Research Division
-
Chor E
National Univ. Singapore Singapore
-
CHONG Pei
Department of Electrical Engineering, National University of Singapore
-
Chong Pei
Department Of Electrical Engineering National University Of Singapore
-
Chong Pei
Department Of Biomedical Sciences Faculty Of Medicine Health And Sciences University Putra Malaysia
-
Joo Moon
Hyundai Electronics Industries Company Limited Memory R&d Division
-
Yeo In
Hyundai Electronics Industries Company Limited Memory R&d Division
-
JOO Moon
Hyundai Electronics Ind. Co. Ltd. Memory R&D Division
-
YEO In
Hyundai Electronics Ind. Co. Ltd. Memory R&D Division
-
Lau Wai
Department Of Electrical Engineering National University Of Singapore
-
FOO Chee
Department of Electrical Engineering, National University of Singapore
-
KHOONG Wai
Department of Electrical Engineering, National University of Singapore
-
Foo Chee
Department Of Electrical Engineering National University Of Singapore
-
Khoong Wai
Department Of Electrical Engineering National University Of Singapore
著作論文
- Investigation of Reliability Degradation of Ultra-Thin Gate Oxides Irradiated under Electron-Beam Lithography Conditions
- Intergrity of Gate Oxides Irradiated Under Electron-Beam Lithography Conditions
- Strong Low-Frequency Noise in Polysilicon Emitter Bipolar Transistors with Interfacial Oxide due to Fluctuations in Tunneling Probabilities