Strong Low-Frequency Noise in Polysilicon Emitter Bipolar Transistors with Interfacial Oxide due to Fluctuations in Tunneling Probabilities
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1992-08-01
著者
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Lau Wai
Department Of Electrical Engineering National University Of Singapore
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CHOR Eng
Department of Electrical Engineering, National University of Singapore
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Chor Eng
Department Of Electrical Engineering National University Of Singapore
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FOO Chee
Department of Electrical Engineering, National University of Singapore
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KHOONG Wai
Department of Electrical Engineering, National University of Singapore
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Foo Chee
Department Of Electrical Engineering National University Of Singapore
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Khoong Wai
Department Of Electrical Engineering National University Of Singapore
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- Strong Low-Frequency Noise in Polysilicon Emitter Bipolar Transistors with Interfacial Oxide due to Fluctuations in Tunneling Probabilities
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