Chim Wai | Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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概要
- 同名の論文著者
- Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computerの論文著者
関連著者
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CHIM Wai
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute
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Chim Wai
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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Cho B
National Univ. Singapore Sgp
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Cho Byung
Department Of Electrical And Computer Engineering National University Of Singapore
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Lim Peng
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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Yue Jeffrey
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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CHO Byung
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute
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Chim Wai
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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Yue Jeffery
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Computer Engineering, National University of Singapore
著作論文
- Latent Damage Generation in Thin Oxides of Metal-Oxide-Semiconductor Devices under High-Field Impulse Stress and Damage Characterization Using Low-Frequency Noise Measurement : Semiconductors
- Hot-Carrier Lifetime Dependence on Channel Width and Silicon Recess Depth in N-Channel Metal-Oxide-Semiconductor Field-Effect-Transistors with the Recessed Local Oxidation of Silicon Isolation Structure(Semiconductors)