CHO Byung | Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute

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概要

関連著者

Cho B
National Univ. Singapore Sgp
Cho Byung
Department Of Electrical And Computer Engineering National University Of Singapore
CHIM Wai
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute
Yue Jeffrey
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
CHO Byung
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute
Chim Wai
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
Yue Jeffery
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Computer Engineering, National University of Singapore

著作論文

Hot-Carrier Lifetime Dependence on Channel Width and Silicon Recess Depth in N-Channel Metal-Oxide-Semiconductor Field-Effect-Transistors with the Recessed Local Oxidation of Silicon Isolation Structure(Semiconductors)

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