CHIM Wai | Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute
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概要
- 同名の論文著者
- Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Computeの論文著者
関連著者
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CHIM Wai
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute
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Chim Wai
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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Cho B
National Univ. Singapore Sgp
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Cho Byung
Department Of Electrical And Computer Engineering National University Of Singapore
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Lim Peng
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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Yue Jeffrey
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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CHO Byung
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Compute
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Chim Wai
Center For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive
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LEONG Kok
Microelectronics Laboratory, Department of Electrical and Computer Enginering, National University o
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CHOI Wee
Microelectronics Laboratory, Department of Electrical and Computer Enginering, National University o
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Chim Wai
Center For Integrated Circuit Failure Analysis And Reliability Department Of Electrical And Computer
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Yue Jeffery
Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Computer Engineering, National University of Singapore
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Chim Wa
Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260
著作論文
- Latent Damage Generation in Thin Oxides of Metal-Oxide-Semiconductor Devices under High-Field Impulse Stress and Damage Characterization Using Low-Frequency Noise Measurement : Semiconductors
- Hot-Carrier Lifetime Dependence on Channel Width and Silicon Recess Depth in N-Channel Metal-Oxide-Semiconductor Field-Effect-Transistors with the Recessed Local Oxidation of Silicon Isolation Structure(Semiconductors)
- Random Telegraphic Signals and Low-Frequency Noise in Rapid-Thermal-Annealed Silicon-Silison Oxide Structures