Cho Byung | Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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概要
- Cho Byung Jinの詳細を見る
- 同名の論文著者
- Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National Universityの論文著者
関連著者
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Cho Byung
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Joo Moon
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Kwong Dim-lee
Department Of Ece The University Of Texas
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Li Ming
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Kwong Dim-lee
Department Of Electrical And Computer Engineering The University Of Texas
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Balasubramanian Narayanan
Institute Of Microelectronics
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Wu Nan
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Zhu Chunxiang
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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YU Hongyu
Silicon Nano Device Lab (SNDL), Department of Electrical and Computer Engineering, National Universi
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Yeo Chia
Silicon Nano Device Lab (sndl) Department Of Electrical And Computer Engineering National University
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Loh W.
Institute Of Microelectronics
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Cho B
National Univ. Singapore Sgp
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Cho Byung
Department Of Electrical And Computer Engineering National University Of Singapore
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Park Chang
Silicon Nano Device Lab Dept. Of Electrical & Computer Engineering National University Of Singap
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WU Nan
Silicon Nano Device Laboratory, Department of Electrical and Computer Engineering, National Universi
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ZHU Chunxiang
Silicon Nano Device Laboratory, Department of Electrical and Computer Engineering, National Universi
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LO G.
Institute of Microelectronics
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BALASUBRAMANIAN N.
Institute of Microelectronics
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Joo Moon
Silicon Nano Device Laboratory Dept. Of Electrical & Computer Engineering Nus
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CHI D.
Institute of Materials Research & Engineering
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KWONG D.-L.
Dept. of ECE, University of Texas
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Li Ming
Silicon Nano Device Lab (sndl). Department Of Electrical And Computer Engineering. National Universi
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Tang Lei
Institute Of Microelectronics
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Cho Byung
Silicon Nano Device Lab (sndl). Department Of Electrical And Computer Engineering. National Universi
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Kwong D.-l.
Dept. Of Ece University Of Texas
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Loh Wei
Silicon Nano Device Lab (sndl). Department Of Electrical And Computer Engineering. National Universi
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YEO Chia
Silicon Nano Device Lab (SNDL), Department of Electrical and Computer Engineering, National Universi
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WANG Wiede
Institute of Materials Research Engineering
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YE J.
Institute of Microelectronics
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Yu H
Univ. California Ca Usa
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Loh T.
Institute Of Microelectronics
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Zang H.
Silicon Nano Device Lab Dept Of Ece National University Of Singapore
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Cho Byung
Silicon Nano Device Lab Dept Of Ece National University Of Singapore
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Cho Byung
Silicon Nano Device Lab Dept. Of Electrical & Computer Engineering National University Of Singap
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Cho Byung
Silicon Nano Device Laboratory Dept. Of Electrical & Computer Engineering Nus
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Balasubramanian Narayanan
Institute of Microelectronics, 11 Science Park Road, 117685 Singapore
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Kwong Dim-Lee
Department of Electrical and Computer Engineering, The University of Texas, Austin, TX 78752, U.S.A.
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Zhu Chunxiang
Silicon Nano Device Lab (SNDL), Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, 119260 Singapore
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Joo Moon
Silicon Nano Device Lab (SNDL), Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, 119260 Singapore
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Yeo Chia
Silicon Nano Device Lab (SNDL), Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, 119260 Singapore
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Li Ming
Silicon Nano Device Lab (SNDL), Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, 119260 Singapore
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Cho Byung
Silicon Nano Device Lab (SNDL), Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, 119260 Singapore
著作論文
- Behavior of Effective Work Function in Metal/High-K Gate Stack under High Temperature Process
- Dependence of Chemical Composition Ratio on Electrical Properties of HfO_2-Al_2O_3 Gate Dielectric
- Investigation of Quasi-Breakdown Mechanism through Post-Quasi-Breakdown Thermal Annealing
- Top-Surface Aluminized and Nitrided Hafnium Oxide Using Synthesis of Thin AlN and HfO_2 Stacked Layer
- Integration of Dual Channels MOSFET on Defect-Free, Tensile-Strained Germanium on Silicon
- Dependence of Chemical Composition Ratio on Electrical Properties of HfO2–Al2O3 Gate Dielectric