Ang Chew | Department Of Electrical And Computer Engineering National University Of Singapore
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概要
関連著者
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Ang Chew
Department Of Electrical And Computer Engineering National University Of Singapore
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ANG Chew
Department of Electrical and Computer Engineering, National University of Singapore
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Cho Byung
Department Of Eecs Kaist
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CHEN Tu
School of Electrical and Electronic Engineering, Nanyang Technological University
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LING Chung
Department of Electrical and Computer Engineering, National University of Singapore
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Ang Chew
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
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Chen Tu
School Of Electrical And Electronic Engineering Nanyang Technological University
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Tan Shyue
School Of Electrical And Electronic Engineering Nanyang Technological University
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Chen Tu
United Microelectronics Corporation (umc) Central R&d Division
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Joo Moon
Hyundai Electronics Industries Company Limited Memory R&d Division
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Yeo In
Hyundai Electronics Industries Company Limited Memory R&d Division
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Kim Sun
Department Of Animal Science And Technology Seoul National University
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JOO Moon
Hyundai Electronics Ind. Co. Ltd. Memory R&D Division
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YEO In
Hyundai Electronics Ind. Co. Ltd. Memory R&D Division
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Yeo I
Hyundai Electronics Ind. Co. Ltd. Kyungki‐do Kor
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Yeo In
Hyundai Electronics Industries Company Limited Semiconductor Advanced Research Division
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Kim Sun
Department Of Chemical Engineering Sogang University
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Cho B
National Univ. Singapore Sgp
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Cho Byung
Department Of Electrical And Computer Engineering National University Of Singapore
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Joo Moon
Hyundai Electronics Industries Company Limited Semiconductor Advanced Research Division
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Ling C
Department Of Electrical And Computer Engineering National University Of Singapore
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Tan Yun
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
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Chan Lap
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
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Kim Sun
Department Of Applied Chemistry Faculty Of Engineering Osaka University
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Ang Chew
Department Of Electrical Engineering National University Of Singapore
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Ling Chung
Department Of Electrical Engineering National University Of Singapore
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Kim Sun
Department Of Electrical Engineering National University Of Singapore
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Chan Lap
Department Of Diagnostic Radiology Kwong Wah Hospital
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Ling Chung
Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260
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Ang Chew
Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260
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Yeo In
Hyundai Electronics Industries Company Limited, Semiconductor Advanced Research Division, Ichon-si, Kyungki-do 467-701, Korea
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Joo Moon
Hyundai Electronics Industries Company Limited, Semiconductor Advanced Research Division, Ichon-si, Kyungki-do 467-701, Korea
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Cho Byung
Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260
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Kim Sun
Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260
著作論文
- Gate Oxide Reliability Concern Associated with X-Ray Lithography
- Influences of Nitridation on Barrier Height Change Caused by Electrical Stress : Semiconductors
- Influence of Nitrogen Proximity from the Si/SiO_2 Interface on Negative Bias Temperature Instability
- Reliability of Thin Gate Oxides Irradiated under X-Ray Lithography Conditions