CHEN Tu | School of Electrical and Electronic Engineering, Nanyang Technological University
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概要
関連著者
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CHEN Tu
School of Electrical and Electronic Engineering, Nanyang Technological University
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Chen Tu
School Of Electrical And Electronic Engineering Nanyang Technological University
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Fung S
Department Of Physics The University Of Hong Kong
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Tse M
School Of Electrical And Electronic Engineering Nanyang Technological University
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Liu Yang
School Of Electrical And Electronic Engineering Nanyang Technological University
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TSE Man
School of Electrical and Electronic Engineering, Nanyang Technological University
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FUNG Steve
Department of Physics, The University of Hong Kong
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ANG Chew
Department of Electrical and Computer Engineering, National University of Singapore
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Ang Chew
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
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Ang Chew
Department Of Electrical And Computer Engineering National University Of Singapore
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Tan Shyue
School Of Electrical And Electronic Engineering Nanyang Technological University
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Chen Tu
United Microelectronics Corporation (umc) Central R&d Division
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FU Yong
School of Mechanical and Production Engineering, Nanyang Technological University
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HSIEH Jang-Hsing
School of Mechanical and Production Engineering, Nanyang Technological University
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YANG Xiao
School of Electrical and Electronic Engineering, Nanyang Technological University
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SUN Chang
School of Electrical and Electronic Engineering, Nanyang Technological University
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FUNG Steve
Physics Department, The University of Hong Kong
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ANG Chew-Hoe
Chartered Semiconductor Manufacturing Ltd.
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Tse Man
School Of Electrical And Electronic Engineering Nanyang Technological University
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Sun Chang
School Of Electrical And Electronic Engineering Nanyang Technological University
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Tan Yun
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
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Fung Steve
Physics Department The University Of Hong Kong
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Yang Xiao
School Of Electrical And Electronic Engineering Nanyang Technological University
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Chan Lap
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
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Chan Lap
Department Of Diagnostic Radiology Kwong Wah Hospital
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Fung Steve
Department Of Physics The University Of Hong Kong
著作論文
- Depth Profiling of Si Oxidation States in Si-Implanted SiO_2 Films by X-Ray Photoelectron Spectroscopy
- Post-Breakdown Conduction Instability of Ultrathin SiO_2 Films Observed in Ramped-Current and Ramped-Voltage Current-Voltage Measurements
- Power-LaW Dependence of Charge Trapping on Injected Charge in Very Thin SiO_2 Films : Semiconductors
- Influences of Nitridation on Barrier Height Change Caused by Electrical Stress : Semiconductors
- Influence of Nitrogen Proximity from the Si/SiO_2 Interface on Negative Bias Temperature Instability