Fung Steve | Physics Department The University Of Hong Kong
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概要
関連著者
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TSE Man
School of Electrical and Electronic Engineering, Nanyang Technological University
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FUNG Steve
Physics Department, The University of Hong Kong
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Tse Man
School Of Electrical And Electronic Engineering Nanyang Technological University
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Fung Steve
Physics Department The University Of Hong Kong
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Tse M
School Of Electrical And Electronic Engineering Nanyang Technological University
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Fung S
Department Of Physics The University Of Hong Kong
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CHEN Tu
School of Electrical and Electronic Engineering, Nanyang Technological University
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SUN Chang
School of Electrical and Electronic Engineering, Nanyang Technological University
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Chen Tu
School Of Electrical And Electronic Engineering Nanyang Technological University
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Sun Chang
School Of Electrical And Electronic Engineering Nanyang Technological University
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Chen Tupei
School Of Electrical And Electronic Engineering Nanyang Technological University
著作論文
- Post-Breakdown Conduction Instability of Ultrathin SiO_2 Films Observed in Ramped-Current and Ramped-Voltage Current-Voltage Measurements
- Modeling the Post-Breakdown I-V Characteristics of Ultrathin SiO_2 Films With Multiple Snapbacks : Semiconductors