Chen Tu | United Microelectronics Corporation (umc) Central R&d Division
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概要
関連著者
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CHEN Tu
School of Electrical and Electronic Engineering, Nanyang Technological University
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ANG Chew
Department of Electrical and Computer Engineering, National University of Singapore
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Ang Chew
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
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Ang Chew
Department Of Electrical And Computer Engineering National University Of Singapore
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Chen Tu
School Of Electrical And Electronic Engineering Nanyang Technological University
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Tan Shyue
School Of Electrical And Electronic Engineering Nanyang Technological University
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Chen Tu
United Microelectronics Corporation (umc) Central R&d Division
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Tan Yun
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
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Chan Lap
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
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Chan Lap
Department Of Diagnostic Radiology Kwong Wah Hospital
著作論文
- Influences of Nitridation on Barrier Height Change Caused by Electrical Stress : Semiconductors
- Influence of Nitrogen Proximity from the Si/SiO_2 Interface on Negative Bias Temperature Instability