Compensation of Native Defect Acceptors in Microcrystalline Ge and SixGe[x] Thin Films by Oxygen Incorporation : Electrical Properties and Solar Cell Performance
スポンサーリンク
概要
著者
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Chang Chia-wen
Research Center For Photovoltaics National Institute Of Advanced Industrial Science And Technology (
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Matsui Takuya
Research Center For Photovoltaics National Institute Of Advanced Industrial Science And Technology (
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Kondo Michio
Research Center For Photovoltaic Technologies Aist
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Mizuno Kouichi
Nagasaki R&D Center, Mitsubishi Heavy Industries, Ltd. (MHI), Nagasaki 851-0301, Japan
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Takeuchi Yoshiaki
Solar Power System Business Unit, MHI, Isahaya, Nagasaki 854-0065, Japan
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