Fabrication of Quartz Cantilevers for Small-Amplitude Dynamic Force Microscopy Using an Optical Deflection Sensor
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概要
- 論文の詳細を見る
We studied about a method of fabricating quartz cantilevers with a conductive tip. The quartz cantilever is a key part for small-amplitude dynamic force microscopy combined with an optical deflection sensor. The stiffness of cantilevers enables us a stable small-amplitude operation, because a sufficiently high oscillation energy, which is based on a high spring constant value prevents the cantilever from contacting the sample. We performed topographic imaging with atomic resolution and site-specific force distance curve measurement using a quartz cantilever at room temperature.
- 2011-08-25
著者
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Sugimoto Yoshiaki
Graduate School Of Engineering Osaka University
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Abe Masayuki
Graduate School Of Engineering Osaka University
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Morita Seizo
Graduate School Of Engineering Osaka University
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Morita Ken-ichi
Graduate School Of Engineering Osaka University
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Abe Masayuki
Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Sasagawa Yuuki
Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Murai Yuusuke
Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Morita Ken-ichi
Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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