Mechanical Properties of Various Phases on In/Si(111) Surfaces Revealed by Atomic Force Microscopy

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概要

• 論文の詳細を見る

著者

• Sugimoto Yoshiaki

  Graduate School Of Engineering Osaka University

• Yamazaki Shiro

  Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan

• Iwata Kota

  Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan

• Tani Yuta

  Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan

関連論文

• Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
• Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
• Fabrication of Quartz Cantilevers for Small-Amplitude Dynamic Force Microscopy Using an Optical Deflection Sensor
• Observation of Subsurface Atoms of the Si(111)-($7{\times}7$) Surface by Atomic Force Microscopy
• High-Spatial-Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2$\times$1) Using Noncontact Atomic Force Microscopy
• Simultaneous Scanning Force/Tunneling Microscopy Using a Quartz Cantilever with a Tungsten Tip
• Tip-induced Local Reconstruction on the Pb/Ge(111) Surface Using Frequency Modulation Atomic Force Microscopy
• Mechanical Properties of Various Phases on In/Si(111) Surfaces Revealed by Atomic Force Microscopy

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