Tandem-Phase Zone-Plate Optics for High-Energy X-ray Focusing
スポンサーリンク
概要
- 論文の詳細を見る
An optical system consisting of two phase zone plates closely arranged in tandem was constructed for focusing high-energy X-rays. The phase zone plates were made from tantalum and their combined thickness was 4.8 μm. An ideal diffraction efficiency of 30% is expected at 30 keV, which is about 3 times higher than that of a single zone plate. The focusing properties at 30 keV were studied both numerically and experimentally. The coaxial tandem arrangement was precisely achieved by observing Young's interference patterns in the far-field produced by the two point foci. A focus size of ${\sim}4$ μm was obtained. The photon flux density was $2.2 \times 10^{13}$ photons/s/mm2, which is 2.4 and 85 times higher than that obtained with a single zone plate and without focusing, respectively. The focused beam was used for scanning X-ray fluorescence microscopy and the residual tin distribution on a float glass surface was imaged.
- 2011-02-25
著者
-
KAGOSHIMA Yasushi
Graduate School of Material Science, University of Hyogo
-
Takano Hidekazu
Graduate School Of Material Science University Of Hyogo
-
Tsusaka Yoshiyuki
Graduate School Of Material Science University Of Hyogo
-
Koyama Takahisa
Graduate School Of Material Science University Of Hyogo
-
Saikubo Akihiko
Graduate School of Material Science, University of Hyogo, Kamigori, Hyogo 678-1297, Japan
-
Saikubo Akihiko
Graduate School and Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
-
Tsusaka Yoshiyuki
Graduate School and Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
-
Kagoshima Yasushi
Graduate School and Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
関連論文
- Image Formation of Periodic Objects Illuminated by Undulator Radiation in a Zone Plate Microscope
- Sub-15nm Hard X-Ray Focusing with a New Total-Reflection Zone Plate
- Sub-100-nm-Resolution Zone Plate Soft X-Ray Microscope Using Undulator Radiation
- Tandem-phase zone-plate optics for high-energy x-ray focusing
- Core Absorption Magnetic Circular Dichroism, Photoemission and Inverse Photoemission of MnAlGa and Mn_2Sb
- Strong Circular Dichroism in Photoelectron Diffraction from Nonchiral, Nonmagnetic Material - Direct Observation of Rotational Motion of Electrons
- Magnetic Circular Dichroism of Ni-Pd Alloys in Ni 2p, 3p, Pd 3p, and 4p Core Excitation Regions : Enhancement of Ni 3d Orbital Moment
- Magnetic Circular Dichroism of Eu, Gd, Tb, Dy, and Ho in the 4d-4f Excitation Region
- OS4(5)-19(OS04W0319) Measurement of Local Minute Strain by Using Synchrotron X-Ray Microbeam
- Evaluation of Lattice Strain in Silicon Substrate Beneath Aluminum Conductor Film Using High-Resolution X-Ray Microbeam Diffractometry
- Formation of Parallel X-Ray Microbeam and Its Application
- Phase-Contrast X-Ray Imaging Using Both Vertically and Horizontally Expanded Synchrotron Radiation X-Rays with Asymmetric Bragg Reflection
- Characterization of Diamond Single Crystals for Synchrotron Radiation Monochromators (Proceedings of the Second International Conference on SRMS(Synchrotron Radiation in Materials Science)(2))
- A Plastic Constitutive Model for Anisotropic Materials and Finite Element Analysis of Strain Localization Process
- FINITE ELEMENT ANALYSIS OF OUT-OF-PLANE DEFORMATION IN LAMINATED SHEET METALS BASED ON AN ANISOTROPIC PLASTICITY MODEL
- 500-nm-Resolution 10 keV X-Ray Imaging Transmission Microscope with Tantalum Phase Zone Plates
- Real-Time Analyses of Strain in Ultrathin Silicon Nanolayers on Insulators during Thermal Oxidation
- Development of a total reflection zone plate for hard X-ray focusing
- Optical Properties of MoSi_2/Si Multilayer Laue Lens as Nanometer X-ray Focusing Device
- Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography
- Real-Time Observation of Fractional-Order X-ray Reflection Profiles of InP(001) During Step-Flow Growth
- Scanning Differential-Phase-Contrast Hard X-Ray Microscopy with Wedge Absorber Detector
- High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope
- 230 nm Resolution 10 keV X-Ray Imaging Transmission Microscope with Parallel Beam Illumination(Instrumentation, Measurement, and Fabrication Technology)
- 10keV X-Ray Phase-Contrast Microscopy for Observing Transparent Specimens : Instrumentation, Measurement, and Fabrication Technology
- Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-Ray Diffraction Method With Sub-μm Spatial Resolution : Instrumentation, Measurement, and Fabrication Technology
- Tandem-Phase Zone-Plate Optics for High-Energy X-ray Focusing
- Reply to ``Comment on `Sub-15 nm Hard X-Ray Focusing with a New Total-Reflection Zone Plate' ''
- Development of a Total Reflection Zone Plate for Hard X-ray Focusing
- Strain and Absorption Coefficient of Finite Ge Structures on Si
- Crystallinity Investigation of Compositionally Graded SiGe Layers by Synchrotron X-ray Cross-Sectional Diffraction
- Two-Dimensional Anisotropic Lattice Deformation Observed in a Commercially Available Strained-Si Wafer
- Real-Time Observation of Fractional-Order X-ray Reflection Profiles of InP(001) During Step-Flow Growth
- High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope
- Time-Lapse Observation of Electrolysis of Copper Sulfate with a Full-Field X-ray Fluorescence Imaging Microscope
- Angle-Dependent Measurement of Near Edge X-ray Absorption Fine Structure of Annealing Effect on Local Structure of Focused-Ion-Beam Chemical Vapor Deposition Diamond-Like Carbon
- Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography