Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography
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概要
- 論文の詳細を見る
A hard X-ray nano-interferometer using two types of zone plate has been developed. One is an ordinary zone plate for a microscope objective, and the other is a newly designed zone plate called an "annular zone plate" for configuring reference waves. We have succeeded in producing interference fringes with variable periods up to a fringeless pattern. The phase-shift distribution of polystyrene microparticles could be imaged clearly with a spatial resolution of 60 nm and a phase sensitivity of $\lambda/40$ at a photon energy of 8 keV. Furthermore, this interferometer was applied to phase tomography for high-spatial-resolution three-dimensional observation.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2006-11-25
著者
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Takano Hidekazu
Graduate School Of Material Science University Of Hyogo
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Tsuji Takuya
Graduate School Of Material Science University Of Hyogo
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Koyama Takahisa
Graduate School Of Material Science University Of Hyogo
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Yoshida Keisuke
Graduate School Of Material Science University Of Hyogo
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Tsusaka Yoshiyuki
Graduate School and Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
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Tsusaka Yoshiyuki
Graduate School of Material Science, University of Hyogo, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
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Kagoshima Yasushi
Graduate School and Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
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Kagoshima Yasushi
Graduate School of Material Science, University of Hyogo, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
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