Reply to ``Comment on `Sub-15 nm Hard X-Ray Focusing with a New Total-Reflection Zone Plate' ''

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Image Formation of Periodic Objects Illuminated by Undulator Radiation in a Zone Plate Microscope
Sub-15nm Hard X-Ray Focusing with a New Total-Reflection Zone Plate
Sub-100-nm-Resolution Zone Plate Soft X-Ray Microscope Using Undulator Radiation
Tandem-phase zone-plate optics for high-energy x-ray focusing
Core Absorption Magnetic Circular Dichroism, Photoemission and Inverse Photoemission of MnAlGa and Mn_2Sb
Strong Circular Dichroism in Photoelectron Diffraction from Nonchiral, Nonmagnetic Material - Direct Observation of Rotational Motion of Electrons
Magnetic Circular Dichroism of Ni-Pd Alloys in Ni 2p, 3p, Pd 3p, and 4p Core Excitation Regions : Enhancement of Ni 3d Orbital Moment
Magnetic Circular Dichroism of Eu, Gd, Tb, Dy, and Ho in the 4d-4f Excitation Region
OS4(5)-19(OS04W0319) Measurement of Local Minute Strain by Using Synchrotron X-Ray Microbeam
Evaluation of Lattice Strain in Silicon Substrate Beneath Aluminum Conductor Film Using High-Resolution X-Ray Microbeam Diffractometry
Formation of Parallel X-Ray Microbeam and Its Application
Phase-Contrast X-Ray Imaging Using Both Vertically and Horizontally Expanded Synchrotron Radiation X-Rays with Asymmetric Bragg Reflection
A Plastic Constitutive Model for Anisotropic Materials and Finite Element Analysis of Strain Localization Process
FINITE ELEMENT ANALYSIS OF OUT-OF-PLANE DEFORMATION IN LAMINATED SHEET METALS BASED ON AN ANISOTROPIC PLASTICITY MODEL
500-nm-Resolution 10 keV X-Ray Imaging Transmission Microscope with Tantalum Phase Zone Plates
Real-Time Analyses of Strain in Ultrathin Silicon Nanolayers on Insulators during Thermal Oxidation
Development of a total reflection zone plate for hard X-ray focusing
Optical Properties of MoSi_2/Si Multilayer Laue Lens as Nanometer X-ray Focusing Device
Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography
Real-Time Observation of Fractional-Order X-ray Reflection Profiles of InP(001) During Step-Flow Growth
Scanning Differential-Phase-Contrast Hard X-Ray Microscopy with Wedge Absorber Detector
High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope
230 nm Resolution 10 keV X-Ray Imaging Transmission Microscope with Parallel Beam Illumination(Instrumentation, Measurement, and Fabrication Technology)
10keV X-Ray Phase-Contrast Microscopy for Observing Transparent Specimens : Instrumentation, Measurement, and Fabrication Technology
Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-Ray Diffraction Method With Sub-μm Spatial Resolution : Instrumentation, Measurement, and Fabrication Technology
Tandem-Phase Zone-Plate Optics for High-Energy X-ray Focusing
Reply to ``Comment on `Sub-15 nm Hard X-Ray Focusing with a New Total-Reflection Zone Plate' ''
Development of a Total Reflection Zone Plate for Hard X-ray Focusing
Crystallinity Investigation of Compositionally Graded SiGe Layers by Synchrotron X-ray Cross-Sectional Diffraction
Two-Dimensional Anisotropic Lattice Deformation Observed in a Commercially Available Strained-Si Wafer
Real-Time Observation of Fractional-Order X-ray Reflection Profiles of InP(001) During Step-Flow Growth
High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope
Time-Lapse Observation of Electrolysis of Copper Sulfate with a Full-Field X-ray Fluorescence Imaging Microscope
Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography

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