Development of a Total Reflection Zone Plate for Hard X-ray Focusing
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概要
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A total reflection zone plate (TRZP) was developed and fabricated as a hard X-ray focusing device. It consists of a Au zone pattern drawn on a flat SiO2 substrate. The reflection only from the zone pattern can be extracted by operating the TRZP with a grazing incident angle between critical angles of Au and SiO2. The effective zone size is fully reduced to the drawn zone size with a small reduction ratio below 1/100. A focusing test using 10 keV X-rays was performed at the “Hyogo-ID” beamline (BL24XU) of SPring-8, and a focusing beam with diffraction-limited size was achieved.
- 2010-03-25
著者
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Takano Hidekazu
Graduate School Of Material Science University Of Hyogo
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Tsuji Takuya
Graduate School Of Material Science University Of Hyogo
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Koyama Takahisa
Graduate School Of Material Science University Of Hyogo
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Yoshiyuki Tsusaka
Graduate School of Material Science, University of Hyogo, 3-2-1 Kouto, Kamigori, Hyogo 678-1297, Japan
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Yasushi Kagoshima
Graduate School of Material Science, University of Hyogo, 3-2-1 Kouto, Kamigori, Hyogo 678-1297, Japan
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Hidekazu Takano
Graduate School of Material Science, University of Hyogo, 3-2-1 Kouto, Kamigori, Hyogo 678-1297, Japan
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